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Title: Scanning method for screening of electronic devices

Abstract

A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.

Inventors:
; ; ;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1485290
Patent Number(s):
10,094,874
Application Number:
15/208,931
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2016 Jul 13
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., and Beutler, Joshua. Scanning method for screening of electronic devices. United States: N. p., 2018. Web.
Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., & Beutler, Joshua. Scanning method for screening of electronic devices. United States.
Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., and Beutler, Joshua. Tue . "Scanning method for screening of electronic devices". United States. https://www.osti.gov/servlets/purl/1485290.
@article{osti_1485290,
title = {Scanning method for screening of electronic devices},
author = {Tangyunyong, Paiboon and Cole, Jr., Edward I. and Loubriel, Guillermo M. and Beutler, Joshua},
abstractNote = {A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {10}
}

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