Scanning method for screening of electronic devices
Abstract
A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1485290
- Patent Number(s):
- 10094874
- Application Number:
- 15/208,931
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2016 Jul 13
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., and Beutler, Joshua. Scanning method for screening of electronic devices. United States: N. p., 2018.
Web.
Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., & Beutler, Joshua. Scanning method for screening of electronic devices. United States.
Tangyunyong, Paiboon, Cole, Jr., Edward I., Loubriel, Guillermo M., and Beutler, Joshua. Tue .
"Scanning method for screening of electronic devices". United States. https://www.osti.gov/servlets/purl/1485290.
@article{osti_1485290,
title = {Scanning method for screening of electronic devices},
author = {Tangyunyong, Paiboon and Cole, Jr., Edward I. and Loubriel, Guillermo M. and Beutler, Joshua},
abstractNote = {A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {10}
}
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