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Title: Wafer-scale pixelated detector system

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.
Inventors:
; ;
Issue Date:
OSTI Identifier:
1482172
Assignee:
Fermi Research Alliance, LLC (Batavia, IL) FNAL
Patent Number(s):
10,084,983
Application Number:
15/167,595
Contract Number:
AC02-07CH11359
Resource Relation:
Patent File Date: 2016 May 27
Research Org:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English

Works referenced in this record:

A Dynamic Slew Correction Circuit for Low Noise Silicon Detector Pre-amplifiers
journal, June 2012
  • Ip, Henry M. D.; Thomas, Stephen; Hart, Matthew
  • IEEE Transactions on Nuclear Science, Vol. 59, Issue 3, p. 642-646
  • DOI: 10.1109/TNS.2012.2189129