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Title: Wafer-scale pixelated detector system

Abstract

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.

Inventors:
; ;
Issue Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1482172
Patent Number(s):
10,084,983
Application Number:
15/167,595
Assignee:
Fermi Research Alliance, LLC (Batavia, IL)
DOE Contract Number:  
AC02-07CH11359
Resource Type:
Patent
Resource Relation:
Patent File Date: 2016 May 27
Country of Publication:
United States
Language:
English

Citation Formats

Fahim, Farah, Deptuch, Grzegorz, and Zimmerman, Tom. Wafer-scale pixelated detector system. United States: N. p., 2018. Web.
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Fahim, Farah, Deptuch, Grzegorz, & Zimmerman, Tom. Wafer-scale pixelated detector system. United States.
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Fahim, Farah, Deptuch, Grzegorz, and Zimmerman, Tom. Tue . "Wafer-scale pixelated detector system". United States. https://www.osti.gov/servlets/purl/1482172.
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@article{osti_1482172,
title = {Wafer-scale pixelated detector system},
author = {Fahim, Farah and Deptuch, Grzegorz and Zimmerman, Tom},
abstractNote = {A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {9}
}
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Works referenced in this record:

Challenges in chip design for the AGIPD detector
journal, December 2010

  • Shi, X.; Dinapoli, R.; Henrich, B.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 624, Issue 2, p. 387-391
  • DOI: 10.1016/j.nima.2010.05.038

A Dynamic Slew Correction Circuit for Low Noise Silicon Detector Pre-amplifiers
journal, June 2012

  • Ip, Henry M. D.; Thomas, Stephen; Hart, Matthew
  • IEEE Transactions on Nuclear Science, Vol. 59, Issue 3, p. 642-646
  • DOI: 10.1109/TNS.2012.2189129
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