Wafer-scale pixelated detector system

Title: Wafer-scale pixelated detector system

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.

Inventors:: Fahim, Farah; Deptuch, Grzegorz; Zimmerman, Tom

Issue Date:: 2018-09-25

OSTI Identifier:: 1482172

Assignee:: Fermi Research Alliance, LLC (Batavia, IL) FNAL

Patent Number(s):: 10,084,983

Application Number:: 15/167,595

Contract Number:: AC02-07CH11359

Resource Relation:: Patent File Date: 2016 May 27

Research Org:: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

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