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Title: Test circuits for integrated circuit counterfeit detection

Abstract

Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.

Inventors:
; ; ;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1471676
Patent Number(s):
10,060,973
Application Number:
14/719,535
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 May 22
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Helinski, Ryan, Pierson, Jr., Lyndon G., Cole, Jr., Edward I., and Thai, Tan Q. Test circuits for integrated circuit counterfeit detection. United States: N. p., 2018. Web.
Helinski, Ryan, Pierson, Jr., Lyndon G., Cole, Jr., Edward I., & Thai, Tan Q. Test circuits for integrated circuit counterfeit detection. United States.
Helinski, Ryan, Pierson, Jr., Lyndon G., Cole, Jr., Edward I., and Thai, Tan Q. Tue . "Test circuits for integrated circuit counterfeit detection". United States. https://www.osti.gov/servlets/purl/1471676.
@article{osti_1471676,
title = {Test circuits for integrated circuit counterfeit detection},
author = {Helinski, Ryan and Pierson, Jr., Lyndon G. and Cole, Jr., Edward I. and Thai, Tan Q.},
abstractNote = {Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {8}
}

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Works referenced in this record:

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