Global to push GA events into
skip to main content

Title: Test circuits for integrated circuit counterfeit detection

Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1471676
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM) SNL-A
Patent Number(s):
10,060,973
Application Number:
14/719,535
Contract Number:
AC04-94AL85000
Resource Relation:
Patent File Date: 2015 May 22
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Similar records in DOepatents and OSTI.GOV collections: