Title: Ultra stable resonant cavity for gas analysis systems

Abstract

Systems and methods for detecting trace gases utilize a resonance optical cavity and a coherent light source coupled to the cavity through a cavity coupling mirror. The cavity is constructed of a material having the same or a similar coefficient of thermal expansion as the mirror elements defining the cavity. The main (bulk) cavity material may be the same as the main (bulk) material that forms the mirror elements, or it may be different. Such resonant cavity configurations provide improved accuracy and stability as compared to existing cavity configurations based upon similar principles.

Inventors:

Koulikov, Serguei

Issue Date:

2018-06-05

Research Org.:

LI-COR, Inc., Lincoln, NE (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1456909

Patent Number(s):

9989729

Application Number:

14/847,977

Assignee:

LI-COR, Inc. (Lincoln, NE)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01S - DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT

Show more

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/39 - using tunable lasers

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01S - DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT

H01S3/0071 - {Beam steering, e.g. whereby a mirror outside the cavity is present to change the beam direction}

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/031 - {Multipass arrangements}

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

G02B7/181 - {with means for compensating for changes in temperature or for controlling the temperature

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/3151 - {using two sources of radiation of different wavelengths
G01N2021/391 - {Intracavity sample}

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

G02B17/004 - {Systems comprising a plurality of reflections between two or more surfaces, e.g. cells, resonators

Show less

DOE Contract Number:  

SC0009530

Resource Type:

Patent

Resource Relation:

Patent File Date: 2015 Sep 08

Country of Publication:

United States

Language:

English

Subject:

42 ENGINEERING