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Title: Grips for testing of electrical characteristics of a specimen under a mechanical load

Abstract

Various technologies to facilitate coupled electrical and mechanical measurement of conductive materials are disclosed herein. A gripping device simultaneously holds a specimen in place and causes contact to be made between the specimen and a plurality of electrodes connected to an electrical measuring device. An electrical characteristic of the specimen is then measured while a mechanical load is applied to the specimen, and a relationship between the mechanical load and changes in the electrical characteristic can be identified.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1436307
Patent Number(s):
9952254
Application Number:
14/940,009
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, MN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Nov 12
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Briggs, Timothy, and Loyola, Bryan. Grips for testing of electrical characteristics of a specimen under a mechanical load. United States: N. p., 2018. Web.
Briggs, Timothy, & Loyola, Bryan. Grips for testing of electrical characteristics of a specimen under a mechanical load. United States.
Briggs, Timothy, and Loyola, Bryan. Tue . "Grips for testing of electrical characteristics of a specimen under a mechanical load". United States. https://www.osti.gov/servlets/purl/1436307.
@article{osti_1436307,
title = {Grips for testing of electrical characteristics of a specimen under a mechanical load},
author = {Briggs, Timothy and Loyola, Bryan},
abstractNote = {Various technologies to facilitate coupled electrical and mechanical measurement of conductive materials are disclosed herein. A gripping device simultaneously holds a specimen in place and causes contact to be made between the specimen and a plurality of electrodes connected to an electrical measuring device. An electrical characteristic of the specimen is then measured while a mechanical load is applied to the specimen, and a relationship between the mechanical load and changes in the electrical characteristic can be identified.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {4}
}

Works referenced in this record:

Electrical socket for TAB IC's
patent, November 1990


Testing apparatus for semiconductor device formed on tape carrier
patent, May 1995


System for the Combined, Probe-Based Mechanical and Electrical Testing of MEMS
patent-application, July 2015