Title: Crystals for krypton helium-alpha line emission microscopy

Abstract

A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.

Inventors:

Koch, Jeffrey A.; Haugh, Michael J.

Issue Date:

2018-04-17

Research Org.:

Nevada Test Site (NTS), Mercury, NV (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1435640

Patent Number(s):

9945795

Application Number:

15/073,946

Assignee:

National Security Technologies, Inc. (North Las Vegas, NV)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N23/207 - Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

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DOE Contract Number:  

AC52-06NA25946

Resource Type:

Patent

Resource Relation:

Patent File Date: 2016 Mar 18

Country of Publication:

United States

Language:

English

Subject:

47 OTHER INSTRUMENTATION