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Title: Crystals for krypton helium-alpha line emission microscopy

Abstract

A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.

Inventors:
;
Issue Date:
Research Org.:
Nevada Test Site (NTS), Mercury, NV (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1435640
Patent Number(s):
9,945,795
Application Number:
15/073,946
Assignee:
National Security Technologies, Inc. (North Las Vegas, NV)
DOE Contract Number:  
AC52-06NA25946
Resource Type:
Patent
Resource Relation:
Patent File Date: 2016 Mar 18
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Koch, Jeffrey A., and Haugh, Michael J. Crystals for krypton helium-alpha line emission microscopy. United States: N. p., 2018. Web.
Koch, Jeffrey A., & Haugh, Michael J. Crystals for krypton helium-alpha line emission microscopy. United States.
Koch, Jeffrey A., and Haugh, Michael J. Tue . "Crystals for krypton helium-alpha line emission microscopy". United States. https://www.osti.gov/servlets/purl/1435640.
@article{osti_1435640,
title = {Crystals for krypton helium-alpha line emission microscopy},
author = {Koch, Jeffrey A. and Haugh, Michael J.},
abstractNote = {A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {4}
}

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