Crystals for krypton helium-alpha line emission microscopy
Abstract
A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.
- Inventors:
- Issue Date:
- Research Org.:
- Nevada Test Site (NTS), Mercury, NV (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1435640
- Patent Number(s):
- 9,945,795
- Application Number:
- 15/073,946
- Assignee:
- National Security Technologies, Inc. (North Las Vegas, NV)
- DOE Contract Number:
- AC52-06NA25946
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2016 Mar 18
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Koch, Jeffrey A., and Haugh, Michael J. Crystals for krypton helium-alpha line emission microscopy. United States: N. p., 2018.
Web.
Koch, Jeffrey A., & Haugh, Michael J. Crystals for krypton helium-alpha line emission microscopy. United States.
Koch, Jeffrey A., and Haugh, Michael J. Tue .
"Crystals for krypton helium-alpha line emission microscopy". United States. https://www.osti.gov/servlets/purl/1435640.
@article{osti_1435640,
title = {Crystals for krypton helium-alpha line emission microscopy},
author = {Koch, Jeffrey A. and Haugh, Michael J.},
abstractNote = {A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {4}
}
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Works referenced in this record:
Primary Extinction and Absorption: a Theoretical Approach Based on the Takagi-Taupin Equations. Application to Spherical Crystals
journal, March 1998
- Chukhovskii, F. N.; Hupe, A.; Rossmanith, E.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 54, Issue 2, p. 191-198
High-energy x-ray microscopy techniques for laser-fusion plasma research at the National Ignition Facility
journal, January 1998
- Koch, Jeffrey A.; Landen, Otto L.; Barbee, Troy W.
- Applied Optics, Vol. 37, Issue 10, p. 1784-1795
Time-resolved ten-channel monochromatic imaging of inertial confinement fusion plasmas
journal, January 2000
- Uschmann, Ingo; Fujita, Kazuhiza; Niki, Izam
- Applied Optics, Vol. 39, Issue 31, p. 5865-5871
Johansson crystals for x-ray diffractometry and demanding spectroscopy applications
conference, September 2011
- Verman, Boris; Ehlers, Bodo; Kim, Bonglea
- SPIE Optical Engineering + Applications
Bent crystal selection and assembling for the LAUE project
conference, September 2013
- Liccardo, V.; Virgilli, E.; Frontera, F.
- SPIE Optical Engineering + Applications
Curved crystals for high-resolution focusing of X and gamma rays through a Laue lens
journal, August 2013
- Guidi, Vincenzo; Bellucci, Valerio; Camattari, Riccardo
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 309, p. 249-253
4.5- and 8-keV emission and absorption x-ray imaging using spherically bent quartz 203 and 211 crystals (invited)
journal, March 2003
- Koch, J. A.; Aglitskiy, Y.; Brown, C.
- Review of Scientific Instruments, Vol. 74, Issue 3, p. 2130-2135
Large aperture point‐focusing diffractor for x rays
journal, April 1988
- Wittry, D. B.; Golijanin, D. M.
- Applied Physics Letters, Vol. 52, Issue 17, p. 1381-1382
Bent crystal analyzer without grooves for inelastic x‐ray scattering
journal, September 1996
- Kushnir, V. I.; Popovici, M.
- Review of Scientific Instruments, Vol. 67, Issue 9, p. 3366-3366
Compact imaging Bragg spectrometer for fusion devices
journal, October 2004
- Bertschinger, G.; Biel, W.; Jaegers, H.
- Review of Scientific Instruments, Vol. 75, Issue 10, p. 3727-3729
X‐ray instrumentation for protein crystallography with SR (abstract)
journal, January 1992
- Popov, A. N.; Kheiker, D. M.; Harutunyan, E. G.
- Review of Scientific Instruments, Vol. 63, Issue 1, p. 1031-1031
Bent crystals by surface grooving method for high-efficiency concentration of hard x-ray photons by a Laue lens
conference, September 2011
- Guidi, V.; Barrière, N.; Bellucci, V.
- SPIE Optical Engineering + Applications
Imaging with spherically bent crystals or reflectors
journal, July 2010
- Bitter, M.; Delgado Aparicio, L. F.; Hill, K. W.
- Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 43, Issue 14, Article No. 144011