Methods and apparatuses for detection of radiation with semiconductor image sensors

Cogliati, Joshua Joseph

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Title: Methods and apparatuses for detection of radiation with semiconductor image sensors

Abstract

A semiconductor image sensor is repeatedly exposed to high-energy photons while a visible light obstructer is in place to block visible light from impinging on the sensor to generate a set of images from the exposures. A composite image is generated from the set of images with common noise substantially removed so the composite image includes image information corresponding to radiated pixels that absorbed at least some energy from the high-energy photons. The composite image is processed to determine a set of bright points in the composite image, each bright point being above a first threshold. The set of bright points is processed to identify lines with two or more bright points that include pixels therebetween that are above a second threshold and identify a presence of the high-energy particles responsive to a number of lines.

Inventors:: Cogliati, Joshua Joseph

Issue Date:: Tue Apr 10 00:00:00 EDT 2018

Research Org.:: Idaho National Laboratory (INL), Idaho Falls, ID (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1433859

Patent Number(s):: 9939534

Application Number:: 14/080,542

Assignee:: Battelle Energy Alliance, LLC (Idaho Falls, ID)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

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G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/244 - {Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like}
G01T7/00 - Details of radiation-measuring instruments

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DOE Contract Number:: AC07-05ID14517

Resource Type:: Patent

Resource Relation:: Patent File Date: 2013 Nov 14

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats


                    Cogliati, Joshua Joseph. Methods and apparatuses for detection of radiation with semiconductor image sensors.  United States: N. p., 2018. 
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                    Cogliati, Joshua Joseph. Methods and apparatuses for detection of radiation with semiconductor image sensors.  United States.

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                    Cogliati, Joshua Joseph. Tue .  
        "Methods and apparatuses for detection of radiation with semiconductor image sensors".  United States.  https://www.osti.gov/servlets/purl/1433859.

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@article{osti_1433859,

  title        = {Methods and apparatuses for detection of radiation with semiconductor image sensors},

  author       = {Cogliati, Joshua Joseph},

  abstractNote = {A semiconductor image sensor is repeatedly exposed to high-energy photons while a visible light obstructer is in place to block visible light from impinging on the sensor to generate a set of images from the exposures. A composite image is generated from the set of images with common noise substantially removed so the composite image includes image information corresponding to radiated pixels that absorbed at least some energy from the high-energy photons. The composite image is processed to determine a set of bright points in the composite image, each bright point being above a first threshold. The set of bright points is processed to identify lines with two or more bright points that include pixels therebetween that are above a second threshold and identify a presence of the high-energy particles responsive to a number of lines.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Apr 10 00:00:00 EDT 2018},

  month        = {Tue Apr 10 00:00:00 EDT 2018}

}

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Title: Methods and apparatuses for detection of radiation with semiconductor image sensors

Abstract

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