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Title: Methods and apparatuses for detection of radiation with semiconductor image sensors

Abstract

A semiconductor image sensor is repeatedly exposed to high-energy photons while a visible light obstructer is in place to block visible light from impinging on the sensor to generate a set of images from the exposures. A composite image is generated from the set of images with common noise substantially removed so the composite image includes image information corresponding to radiated pixels that absorbed at least some energy from the high-energy photons. The composite image is processed to determine a set of bright points in the composite image, each bright point being above a first threshold. The set of bright points is processed to identify lines with two or more bright points that include pixels therebetween that are above a second threshold and identify a presence of the high-energy particles responsive to a number of lines.

Inventors:
Issue Date:
Research Org.:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1433859
Patent Number(s):
9,939,534
Application Number:
14/080,542
Assignee:
Battelle Energy Alliance, LLC (Idaho Falls, ID) INL
DOE Contract Number:  
AC07-05ID14517
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Nov 14
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Cogliati, Joshua Joseph. Methods and apparatuses for detection of radiation with semiconductor image sensors. United States: N. p., 2018. Web.
Cogliati, Joshua Joseph. Methods and apparatuses for detection of radiation with semiconductor image sensors. United States.
Cogliati, Joshua Joseph. Tue . "Methods and apparatuses for detection of radiation with semiconductor image sensors". United States. https://www.osti.gov/servlets/purl/1433859.
@article{osti_1433859,
title = {Methods and apparatuses for detection of radiation with semiconductor image sensors},
author = {Cogliati, Joshua Joseph},
abstractNote = {A semiconductor image sensor is repeatedly exposed to high-energy photons while a visible light obstructer is in place to block visible light from impinging on the sensor to generate a set of images from the exposures. A composite image is generated from the set of images with common noise substantially removed so the composite image includes image information corresponding to radiated pixels that absorbed at least some energy from the high-energy photons. The composite image is processed to determine a set of bright points in the composite image, each bright point being above a first threshold. The set of bright points is processed to identify lines with two or more bright points that include pixels therebetween that are above a second threshold and identify a presence of the high-energy particles responsive to a number of lines.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {4}
}

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