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Title: Charge gradient microscopy

Abstract

A method for rapid imaging of a material specimen includes positioning a tip to contact the material specimen, and applying a force to a surface of the material specimen via the tip. In addition, the method includes moving the tip across the surface of the material specimen while removing electrical charge therefrom, generating a signal produced by contact between the tip and the surface, and detecting, based on the data, the removed electrical charge induced through the tip during movement of the tip across the surface. The method further includes measuring the detected electrical charge.

Inventors:
;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1419770
Patent Number(s):
9885861
Application Number:
14/258,965
Assignee:
UCHICAGO ARGONNE, LLC (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Apr 22
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Roelofs, Andreas, and Hong, Seungbum. Charge gradient microscopy. United States: N. p., 2018. Web.
Roelofs, Andreas, & Hong, Seungbum. Charge gradient microscopy. United States.
Roelofs, Andreas, and Hong, Seungbum. Tue . "Charge gradient microscopy". United States. https://www.osti.gov/servlets/purl/1419770.
@article{osti_1419770,
title = {Charge gradient microscopy},
author = {Roelofs, Andreas and Hong, Seungbum},
abstractNote = {A method for rapid imaging of a material specimen includes positioning a tip to contact the material specimen, and applying a force to a surface of the material specimen via the tip. In addition, the method includes moving the tip across the surface of the material specimen while removing electrical charge therefrom, generating a signal produced by contact between the tip and the surface, and detecting, based on the data, the removed electrical charge induced through the tip during movement of the tip across the surface. The method further includes measuring the detected electrical charge.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {2}
}

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