Light-emitting device test systems
Abstract
Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.
- Inventors:
- Issue Date:
- Research Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EE) (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1417881
- Patent Number(s):
- 9874597
- Application Number:
- 14/696,891
- Assignee:
- KLA-Tenor Corporation (Milpitas, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- EE0005877
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Apr 27
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
McCord, Mark, Brodie, Alan, George, James, Guan, Yu, and Nyffenegger, Ralph. Light-emitting device test systems. United States: N. p., 2018.
Web.
McCord, Mark, Brodie, Alan, George, James, Guan, Yu, & Nyffenegger, Ralph. Light-emitting device test systems. United States.
McCord, Mark, Brodie, Alan, George, James, Guan, Yu, and Nyffenegger, Ralph. Tue .
"Light-emitting device test systems". United States. https://www.osti.gov/servlets/purl/1417881.
@article{osti_1417881,
title = {Light-emitting device test systems},
author = {McCord, Mark and Brodie, Alan and George, James and Guan, Yu and Nyffenegger, Ralph},
abstractNote = {Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {1}
}
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