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Title: Micro-balance sensor integrated with atomic layer deposition chamber

Abstract

The invention is directed to QCM measurements in monitoring ALD processes. Previously, significant barriers remain in the ALD processes and accurate execution. To turn this exclusively dedicated in situ technique into a routine characterization method, an integral QCM fixture was developed. This new design is easily implemented on a variety of ALD tools, allows rapid sample exchange, prevents backside deposition, and minimizes both the footprint and flow disturbance. Unlike previous QCM designs, the fast thermal equilibration enables tasks such as temperature-dependent studies and ex situ sample exchange, further highlighting the feasibility of this QCM design for day-to-day use. Finally, the in situ mapping of thin film growth rates across the ALD reactor was demonstrated in a popular commercial tool operating in both continuous and quasi-static ALD modes.

Inventors:
; ; ;
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1415625
Patent Number(s):
9856563
Application Number:
13/591,498
Assignee:
UCHICAGO ARGONNE, LLC (Chicago, IL)
Patent Classifications (CPCs):
C - CHEMISTRY C23 - COATING METALLIC MATERIAL C23C - COATING METALLIC MATERIAL
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Aug 22
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Martinson, Alex B. F., Libera, Joseph A., Elam, Jeffrey W., and Riha, Shannon C. Micro-balance sensor integrated with atomic layer deposition chamber. United States: N. p., 2018. Web.
Martinson, Alex B. F., Libera, Joseph A., Elam, Jeffrey W., & Riha, Shannon C. Micro-balance sensor integrated with atomic layer deposition chamber. United States.
Martinson, Alex B. F., Libera, Joseph A., Elam, Jeffrey W., and Riha, Shannon C. Tue . "Micro-balance sensor integrated with atomic layer deposition chamber". United States. https://www.osti.gov/servlets/purl/1415625.
@article{osti_1415625,
title = {Micro-balance sensor integrated with atomic layer deposition chamber},
author = {Martinson, Alex B. F. and Libera, Joseph A. and Elam, Jeffrey W. and Riha, Shannon C.},
abstractNote = {The invention is directed to QCM measurements in monitoring ALD processes. Previously, significant barriers remain in the ALD processes and accurate execution. To turn this exclusively dedicated in situ technique into a routine characterization method, an integral QCM fixture was developed. This new design is easily implemented on a variety of ALD tools, allows rapid sample exchange, prevents backside deposition, and minimizes both the footprint and flow disturbance. Unlike previous QCM designs, the fast thermal equilibration enables tasks such as temperature-dependent studies and ex situ sample exchange, further highlighting the feasibility of this QCM design for day-to-day use. Finally, the in situ mapping of thin film growth rates across the ALD reactor was demonstrated in a popular commercial tool operating in both continuous and quasi-static ALD modes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {1}
}

Works referenced in this record:

Quartz oscillator measuring head
patent, December 1982


Method for hydrating a cycloolefin
patent, April 1994


Wall deposition monitoring system
patent, September 1999


Reusable mass-sensor in manufacture of organic light-emitting devices
patent, May 2003


Reducing deposition of process residues on a surface in a chamber
patent, December 2004


Method and apparatus for measuring electron density of plasma and plasma processing apparatus
patent, September 2009


Synthesis of transparent conducting oxide coatings
patent, May 2010


Hermetic pressure transducer
patent-application, January 2004


Adjustable height PIF Probe
patent-application, May 2009


Electron Transport in Dye-Sensitized Solar Cells Based on ZnO Nanotubes: Evidence for Highly Efficient Charge Collection and Exceptionally Rapid Dynamics
journal, April 2009

  • Martinson, Alex B. F.; Góes, Márcio S.; Fabregat-Santiago, Francisco
  • The Journal of Physical Chemistry A, Vol. 113, Issue 16, p. 4015-4021
  • https://doi.org/10.1021/jp810406q

Radial Electron Collection in Dye-Sensitized Solar Cells
journal, September 2008


ZnO Nanotube Based Dye-Sensitized Solar Cells
June 2007


Atomic Layer Deposition of Fe2O3 Using Ferrocene and Ozone
journal, February 2011

  • Martinson, Alex B. F.; DeVries, Michael J.; Libera, Joseph A.
  • The Journal of Physical Chemistry C, Vol. 115, Issue 10, p. 4333-4339
  • https://doi.org/10.1021/jp110203x

Compensation of temperature effects in quartz crystal microbalance measurements
journal, January 2002


Study of atomic layer epitaxy of zinc oxide by in-situ quartz crystal microgravimetry
journal, January 2000


In situ characterization of ALE growth by reagent pulse delay times in a flow-type reactor
journal, January 1994


ALD for clean energy conversion, utilization, and storage
journal, November 2011


GaPO4 Sensors for Gravimetric Monitoring during Atomic Layer Deposition at High Temperatures
journal, June 2005


Nucleation and Growth of Noble Metals on Oxide Surfaces Using Atomic Layer Deposition
journal, January 2007


Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition
journal, August 2002


Atomic Layer Deposition of Ir−Pt Alloy Films
journal, April 2010


Low-Temperature Al2O3 Atomic Layer Deposition
journal, February 2004