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Title: Extending the range of turbidity measurement using polarimetry

Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam.
Inventors:
Issue Date:
OSTI Identifier:
1410283
Assignee:
UT-Battelle, LLC (Oak Ridge, TN) ORNL
Patent Number(s):
9,823,183
Application Number:
14/855,307
Contract Number:
AC05-00OR22725
Resource Relation:
Patent File Date: 2015 Sep 15
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Other works cited in this record:

Biological particle identification apparatus
patent, December 1989

Particle size analysis utilizing polarization intensity differential scattering
patent, April 1992

Method and apparatus for detection, analysis and identification of particles
patent, May 1996

Apparatus and process for the non-invasive measurement of optically active compounds
patent, August 1998

Instrument for determining static and/or dynamic light scattering
patent, September 2000

Focused laser light turbidity sensor
patent, May 2003

Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
patent, April 2004

Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (PDS)
patent, June 2011

Chlorophyll and turbidity sensor system
patent, February 2014

Particle Characterization Device
patent-application, July 2011

Method For Using Polarization Gating To Measure A Scattering Sample
patent-application, February 2014

Mueller matrix decomposition for extraction of individual polarization parameters from complex turbid media exhibiting multiple scattering, optical activity, and linear birefringence
journal, January 2008
  • Ghosh, Nirmalya; Wood, Michael F. G.; Vitkin, I. Alex
  • Journal of Biomedical Optics, Vol. 13, Issue 4, Article No. 044036
  • DOI: 10.1117/1.2960934

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