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Title: Precise annealing of focal plane arrays for optical detection

Precise annealing of identified defective regions of a Focal Plane Array ("FPA") (e.g., exclusive of non-defective regions of the FPA) facilitates removal of defects from an FPA that has been hybridized and/or packaged with readout electronics. Radiation is optionally applied under operating conditions, such as under cryogenic temperatures, such that performance of an FPA can be evaluated before, during, and after annealing without requiring thermal cycling.
Issue Date:
OSTI Identifier:
National Technology & Engineering Solutions of Sandia, LLC SNL-A
Patent Number(s):
Application Number:
Contract Number:
Resource Relation:
Patent File Date: 2015 Aug 12
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
Country of Publication:
United States

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journal, March 2007
  • Yan, Jiwang; Asami, Tooru; Kuriyagawa, Tsunemoto
  • Semiconductor Science and Technology, Vol. 22, Issue 4, p. 392-395
  • DOI: 10.1088/0268-1242/22/4/016

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