Micro electro-mechanical heater

Oh, Yunje; Asif, Syed Amanulla Syed; Cyrankowski, Edward; Warren, Oden Lee

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Title: Micro electro-mechanical heater

Abstract

A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

Inventors:: Oh, Yunje; Asif, Syed Amanulla Syed; Cyrankowski, Edward; Warren, Oden Lee

Issue Date:: Tue Sep 12 00:00:00 EDT 2017

Research Org.:: Hysitron, Inc., Eden Prairie, MN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1390064

Patent Number(s):: 9759641

Application Number:: 14/948,549

Assignee:: Hysitron, Inc.

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N1/42 - Low-temperature sample treatment, e.g. cryofixation
G01N2203/0226 - High temperature
G01N2203/0286 - Miniature specimen
G01N2203/04 - Chucks, fixtures, jaws, holders or anvils
G01N2223/418 - electron microscope
G01N3/08 - by applying steady tensile or compressive forces
G01N3/18 - Performing tests at high or low temperatures
G01N3/42 - by performing impressions under a steady load by indentors, e.g. sphere, pyramid

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J37/20 - Means for supporting or positioning the objects or the material

H - ELECTRICITY H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR H05B - ELECTRIC HEATING
H05B1/023 - {Industrial applications}
H05B3/06 - Heater elements structurally combined with coupling elements or holders
H05B3/22 - non-flexible

Show less

DOE Contract Number:: FG02-07ER84812

Resource Type:: Patent

Resource Relation:: Patent File Date: 2015 Nov 23

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING; 36 MATERIALS SCIENCE

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                    Oh, Yunje, Asif, Syed Amanulla Syed, Cyrankowski, Edward, and Warren, Oden Lee. Micro electro-mechanical heater.  United States: N. p., 2017. 
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                    Oh, Yunje, Asif, Syed Amanulla Syed, Cyrankowski, Edward, & Warren, Oden Lee. Micro electro-mechanical heater.  United States.

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                    Oh, Yunje, Asif, Syed Amanulla Syed, Cyrankowski, Edward, and Warren, Oden Lee. Tue .  
        "Micro electro-mechanical heater".  United States.  https://www.osti.gov/servlets/purl/1390064.

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@article{osti_1390064,

  title        = {Micro electro-mechanical heater},

  author       = {Oh, Yunje and Asif, Syed Amanulla Syed and Cyrankowski, Edward and Warren, Oden Lee},

  abstractNote = {A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Sep 12 00:00:00 EDT 2017},

  month        = {Tue Sep 12 00:00:00 EDT 2017}

}

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