Luminescence imaging systems and methods for evaluating photovoltaic devices

Johnston, Steven

Title: Luminescence imaging systems and methods for evaluating photovoltaic devices

Abstract

The present disclosure relates to optical methods and systems for detecting defects in photovoltaic (PV) devices such as PV cells, PV panels, PV modules, and PV arrays.

Inventors:: Johnston, Steven

Issue Date:: 2017-05-02

Research Org.:: National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1354783

Patent Number(s):: 9641125

Application Number:: 15/002,628

Assignee:: Alliance for Sustainable Energy, LLC

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2021/646 - {Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects}
G01N21/63 - optically excited
G01N21/6456 - {Spatial resolved fluorescence measurements
G01N21/6489 - {Photoluminescence of semiconductors}
G01N21/956 - Inspecting patterns on the surface of objects

H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
H02S50/15 - using optical means, e.g. using electroluminescence

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
Y02E10/50 - Photovoltaic [PV] energy

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DOE Contract Number:: AC36-08G028308

Resource Type:: Patent

Resource Relation:: Patent File Date: 2016 Jan 21

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 14 SOLAR ENERGY

Citation Formats


                    Johnston, Steven. Luminescence imaging systems and methods for evaluating photovoltaic devices.  United States: N. p., 2017. 
        Web.

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                    Johnston, Steven. Luminescence imaging systems and methods for evaluating photovoltaic devices.  United States.

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                    Johnston, Steven. Tue .  
        "Luminescence imaging systems and methods for evaluating photovoltaic devices".  United States.  https://www.osti.gov/servlets/purl/1354783.

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@article{osti_1354783,

  title        = {Luminescence imaging systems and methods for evaluating photovoltaic devices},

  author       = {Johnston, Steven},

  abstractNote = {The present disclosure relates to optical methods and systems for detecting defects in photovoltaic (PV) devices such as PV cells, PV panels, PV modules, and PV arrays.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2017},

  month        = {5}

}

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Works referenced in this record:

Measuring Method And Device For Characterizing A Semiconductor Component
patent-application, January 2011

Carstensen, Jurgen; Schutt, Andreas; Foll, Helmut
US Patent Application 12/918921; 20110012636
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110012636

Quantitative Series Resistance Imaging Of Photovoltaic Cells
patent-application, February 2014

Trupke, Thorsten; Weber, Juergen
US Patent Application 14/110712; 20140039820
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140039820

Separation of Doping Density and Minority Carrier Lifetime in Photoluminescence Measurements on Semiconductor Materials
patent-application, March 2016

Trupke, Thorsten
US Patent Application 14/869469; 20160084764
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20160084764

Investigation of silicon heterojunction solar cells by photoluminescence under DC-bias
journal, January 2013

Courtois, Guillaume; Chatterjee, Parsathi; Suendo, Veinardi
EPJ Photovoltaics, Vol. 4, 45106
https://doi.org/10.1051/epjpv/2013022

Non-contact Determination of Local Efficiency of mc-Si Solar Cells Using Quantitative Lock-In Thermographic and Carrierographic (Photoluminescence) Imaging
journal, November 2014

Liu, J. Y.; Melnikov, A.; Mandelis, A.
International Journal of Thermophysics, Vol. 36, Issue 5-6, p. 987-996
https://doi.org/10.1007/s10765-014-1786-y

2D network simulation and luminescence characterization of Cu(In,Ga)Se2 thin film modules: 2D network simulation and luminescence characterization
journal, March 2012

Ott, Thomas; Runai, Francillina Robert; Schwäble, Fabian
Progress in Photovoltaics: Research and Applications, Vol. 20, Issue 5, p. 600-605
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Luminescence radiation spectroscopy of silicon solar cells
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Stojan, R.; Vaněk, J.; Malý, M.
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Contactless Qualitative Series Resistance Imaging on Solar Cells
journal, April 2012

Kasemann, M.; Reindl, L. M.; Michl, B.
IEEE Journal of Photovoltaics, Vol. 2, Issue 2, p. 181-183
https://doi.org/10.1109/JPHOTOV.2012.2184524

Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging
conference, November 2013

Ebner, Rita; Kubicek, Bernhard; Ujvari, Gusztav
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
https://doi.org/10.1109/IECON.2013.6700488

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Title: Luminescence imaging systems and methods for evaluating photovoltaic devices

Abstract

Citation Formats

Measuring Method And Device For Characterizing A Semiconductor Component patent-application, January 2011

Quantitative Series Resistance Imaging Of Photovoltaic Cells patent-application, February 2014

Separation of Doping Density and Minority Carrier Lifetime in Photoluminescence Measurements on Semiconductor Materials patent-application, March 2016

Investigation of silicon heterojunction solar cells by photoluminescence under DC-bias journal, January 2013

Non-contact Determination of Local Efficiency of mc-Si Solar Cells Using Quantitative Lock-In Thermographic and Carrierographic (Photoluminescence) Imaging journal, November 2014

2D network simulation and luminescence characterization of Cu(In,Ga)Se2 thin film modules: 2D network simulation and luminescence characterization journal, March 2012

Luminescence radiation spectroscopy of silicon solar cells conference, September 2013

Contactless Qualitative Series Resistance Imaging on Solar Cells journal, April 2012

Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging conference, November 2013

Measuring Method And Device For Characterizing A Semiconductor Component
patent-application, January 2011

Quantitative Series Resistance Imaging Of Photovoltaic Cells
patent-application, February 2014

Separation of Doping Density and Minority Carrier Lifetime in Photoluminescence Measurements on Semiconductor Materials
patent-application, March 2016

Investigation of silicon heterojunction solar cells by photoluminescence under DC-bias
journal, January 2013

Non-contact Determination of Local Efficiency of mc-Si Solar Cells Using Quantitative Lock-In Thermographic and Carrierographic (Photoluminescence) Imaging
journal, November 2014

2D network simulation and luminescence characterization of Cu(In,Ga)Se2 thin film modules: 2D network simulation and luminescence characterization
journal, March 2012

Luminescence radiation spectroscopy of silicon solar cells
conference, September 2013

Contactless Qualitative Series Resistance Imaging on Solar Cells
journal, April 2012

Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging
conference, November 2013