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Title: Luminescence imaging systems and methods for evaluating photovoltaic devices

The present disclosure relates to optical methods and systems for detecting defects in photovoltaic (PV) devices such as PV cells, PV panels, PV modules, and PV arrays.
Inventors:
Issue Date:
OSTI Identifier:
1354783
Assignee:
Alliance for Sustainable Energy, LLC NREL
Patent Number(s):
9,641,125
Application Number:
15/002,628
Contract Number:
AC36-08G028308
Resource Relation:
Patent File Date: 2016 Jan 21
Research Org:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 14 SOLAR ENERGY

Other works cited in this record:

Measuring Method And Device For Characterizing A Semiconductor Component
patent-application, January 2011

Quantitative Series Resistance Imaging Of Photovoltaic Cells
patent-application, February 2014

Investigation of silicon heterojunction solar cells by photoluminescence under DC-bias
journal, January 2013
  • Courtois, Guillaume; Chatterjee, Parsathi; Suendo, Veinardi
  • EPJ Photovoltaics, Vol. 4, 45106
  • DOI: 10.1051/epjpv/2013022

Non-contact Determination of Local Efficiency of mc-Si Solar Cells Using Quantitative Lock-In Thermographic and Carrierographic (Photoluminescence) Imaging
journal, November 2014
  • Liu, J. Y.; Melnikov, A.; Mandelis, A.
  • International Journal of Thermophysics, Vol. 36, Issue 5-6, p. 987-996
  • DOI: 10.1007/s10765-014-1786-y

2D network simulation and luminescence characterization of Cu(In,Ga)Se2 thin film modules: 2D network simulation and luminescence characterization
journal, March 2012
  • Ott, Thomas; Runai, Francillina Robert; Schwäble, Fabian
  • Progress in Photovoltaics: Research and Applications, Vol. 20, Issue 5, p. 600-605
  • DOI: 10.1002/pip.2171

Luminescence radiation spectroscopy of silicon solar cells
conference, September 2013

Contactless Qualitative Series Resistance Imaging on Solar Cells
journal, April 2012

Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging
conference, November 2013
  • Ebner, Rita; Kubicek, Bernhard; Ujvari, Gusztav
  • Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • DOI: 10.1109/IECON.2013.6700488

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