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Title: Neutron imaging systems utilizing lithium-containing semiconductor crystals

A neutron imaging system, including: a plurality of Li-III-VI.sub.2 semiconductor crystals arranged in an array, wherein III represents a Group III element and VI represents a Group VI element; and electronics operable for detecting and a charge in each of the plurality of crystals in the presence of neutrons and for imaging the neutrons. Each of the crystals is formed by: melting the Group III element; adding the Li to the melted Group III element at a rate that allows the Li and Group III element to react, thereby providing a single phase Li-III compound; and adding the Group VI element to the single phase Li-III compound and heating. Optionally, each of the crystals is also formed by doping with a Group IV element activator.
Inventors:
;
Issue Date:
OSTI Identifier:
1353068
Assignee:
Consolidates Nuclear Security, LLC Y-12
Patent Number(s):
9,632,190
Application Number:
14/230,372
Contract Number:
AC05-00OR22800
Resource Relation:
Patent File Date: 2014 Mar 31
Research Org:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE

Other works cited in this record:

Semiconductor radiation detector
patent, March 2010

Growth and properties of LiGaX2 (X = S, Se, Te) single crystals for nonlinear optical applications in the mid-IR
journal, April 2003
  • Isaenko, L.; Yelisseyev, A.; Lobanov, S.
  • Crystal Research and Technology, Vol. 38, Issue 35, p. 379-387
  • DOI: 10.1002/crat.200310047

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