Manually operated small envelope scanner system
Abstract
A scanner system and method for acquisition of position-based ultrasonic inspection data are described. The scanner system includes an inspection probe and a first non-contact linear encoder having a first sensor and a first scale to track inspection probe position. The first sensor is positioned to maintain a continuous non-contact interface between the first sensor and the first scale and to maintain a continuous alignment of the first sensor with the inspection probe. The scanner system may be used to acquire two-dimensional inspection probe position data by including a second non-contact linear encoder having a second sensor and a second scale, the second sensor positioned to maintain a continuous non-contact interface between the second sensor and the second scale and to maintain a continuous alignment of the second sensor with the first sensor.
- Inventors:
- Issue Date:
- Research Org.:
- (United States); Bettis Atomic Power Laboratory (BAPL), West Mifflin, PA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1351825
- Patent Number(s):
- 9625421
- Application Number:
- 14/254,058
- Assignee:
- U.S. Department of Energy
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC11-98PN38206
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Apr 16
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Sword, Charles Keith. Manually operated small envelope scanner system. United States: N. p., 2017.
Web.
Sword, Charles Keith. Manually operated small envelope scanner system. United States.
Sword, Charles Keith. Tue .
"Manually operated small envelope scanner system". United States. https://www.osti.gov/servlets/purl/1351825.
@article{osti_1351825,
title = {Manually operated small envelope scanner system},
author = {Sword, Charles Keith},
abstractNote = {A scanner system and method for acquisition of position-based ultrasonic inspection data are described. The scanner system includes an inspection probe and a first non-contact linear encoder having a first sensor and a first scale to track inspection probe position. The first sensor is positioned to maintain a continuous non-contact interface between the first sensor and the first scale and to maintain a continuous alignment of the first sensor with the inspection probe. The scanner system may be used to acquire two-dimensional inspection probe position data by including a second non-contact linear encoder having a second sensor and a second scale, the second sensor positioned to maintain a continuous non-contact interface between the second sensor and the second scale and to maintain a continuous alignment of the second sensor with the first sensor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {4}
}
Works referenced in this record:
Multiple beam scanning system for an imaging device
patent, June 1999
- Squires, David P.; Goulet, Ronald G.; Menard, Alan W.
- US Patent Document 5,912,458
System for inspecting and/or processing a sample
patent, January 2003
- Takeshita, Shinpei; Frosien, Jürgen
- US Patent Document 6,509,969