Full information acquisition in scanning probe microscopy and spectroscopy
Abstract
Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1349677
- Patent Number(s):
- 9612257
- Application Number:
- 15/063,144
- Assignee:
- UT-Battelle, LLC
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2016 Mar 07
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Jesse, Stephen, Belianinov, Alex, Kalinin, Sergei V., and Somnath, Suhas. Full information acquisition in scanning probe microscopy and spectroscopy. United States: N. p., 2017.
Web.
Jesse, Stephen, Belianinov, Alex, Kalinin, Sergei V., & Somnath, Suhas. Full information acquisition in scanning probe microscopy and spectroscopy. United States.
Jesse, Stephen, Belianinov, Alex, Kalinin, Sergei V., and Somnath, Suhas. Tue .
"Full information acquisition in scanning probe microscopy and spectroscopy". United States. https://www.osti.gov/servlets/purl/1349677.
@article{osti_1349677,
title = {Full information acquisition in scanning probe microscopy and spectroscopy},
author = {Jesse, Stephen and Belianinov, Alex and Kalinin, Sergei V. and Somnath, Suhas},
abstractNote = {Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {4}
}
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