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Title: Full information acquisition in scanning probe microscopy and spectroscopy

Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1349677
Assignee:
UT-Battelle, LLC ORNL
Patent Number(s):
9,612,257
Application Number:
15/063,144
Contract Number:
AC05-00OR22725
Resource Relation:
Patent File Date: 2016 Mar 07
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Other works cited in this record:

Model-based extraction of material properties in multifrequency atomic force microscopy
journal, May 2012
  • Forchheimer, Daniel; Platz, Daniel; TholĂ©n, Erik A.
  • Physical Review B, Vol. 85, Issue 19, Article No. 195449
  • DOI: 10.1103/PhysRevB.85.195449

New modes for subsurface atomic force microscopy through nanomechanical coupling
journal, December 2009
  • Tetard, L.; Passian, A.; Thundat, T.
  • Nature Nanotechnology, Vol. 5, Issue 2, p. 105-109
  • DOI: 10.1038/nnano.2009.454

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