Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields

Title: Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields

Abstract

A method and a dual-stage trapped-flux magnet cryostat apparatus are provided for implementing enhanced measurements at high magnetic fields. The dual-stage trapped-flux magnet cryostat system includes a trapped-flux magnet (TFM). A sample, for example, a single crystal, is adjustably positioned proximate to the surface of the TFM, using a translation stage such that the distance between the sample and the surface is selectively adjusted. A cryostat is provided with a first separate thermal stage provided for cooling the TFM and with a second separate thermal stage provided for cooling sample.

Inventors:: Islam, Zahirul; Das, Ritesh K.; Weinstein, Roy

Issue Date:: 2015-04-14

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1348218

Patent Number(s):: 9,007,058

Application Number:: 13/405,436

Assignee:: UChicago Argonne, LLC (Chicago, IL) ANL

DOE Contract Number:: AC02-06CH11357

Resource Type:: Patent

Resource Relation:: Patent File Date: 2012 Feb 27

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 42 ENGINEERING

Citation Formats


                    Islam, Zahirul, Das, Ritesh K., and Weinstein, Roy. Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields.  United States: N. p., 2015. 
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                    Islam, Zahirul, Das, Ritesh K., & Weinstein, Roy. Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields.  United States.

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                    Islam, Zahirul, Das, Ritesh K., and Weinstein, Roy. Tue .  
        "Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields".  United States.  https://www.osti.gov/servlets/purl/1348218.

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@article{osti_1348218,

  title        = {Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields},

  author       = {Islam, Zahirul and Das, Ritesh K. and Weinstein, Roy},

  abstractNote = {A method and a dual-stage trapped-flux magnet cryostat apparatus are provided for implementing enhanced measurements at high magnetic fields. The dual-stage trapped-flux magnet cryostat system includes a trapped-flux magnet (TFM). A sample, for example, a single crystal, is adjustably positioned proximate to the surface of the TFM, using a translation stage such that the distance between the sample and the surface is selectively adjusted. A cryostat is provided with a first separate thermal stage provided for cooling the TFM and with a second separate thermal stage provided for cooling sample.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2015},

  month        = {4}

}

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Works referenced in this record:

Magnetic property characterization system employing a single sensing coil arrangement to measure both AC susceptibility and DC magnetization
patent, April 1996

Krause, John K.; Wang, Victor; Dodrill, Bradley C.
US Patent Document 5,506,500
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/5506500

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Similar Records

Title: Dual-stage trapped-flux magnet cryostat for measurements at high magnetic fields

Abstract

Citation Formats

Magnetic property characterization system employing a single sensing coil arrangement to measure both AC susceptibility and DC magnetization patent, April 1996

Magnetic property characterization system employing a single sensing coil arrangement to measure both AC susceptibility and DC magnetization
patent, April 1996