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Title: Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument

A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.
Inventors:
; ; ; ; ;
Issue Date:
OSTI Identifier:
1348215
Assignee:
UChicago Argonne, LLC (Chicago, IL) ANL
Patent Number(s):
9,008,272
Application Number:
13/551,788
Contract Number:
AC02-06CH11357
Resource Relation:
Patent File Date: 2012 Jul 18
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE