Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument

Title: Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument

A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.

Inventors:: Shu, Deming; Shvydko, Yuri; Stoupin, Stanislav A.; Khachatryan, Ruben; Goetze, Kurt A.; Roberts, Timothy

Issue Date:: 2015-04-14

OSTI Identifier:: 1348215

Assignee:: UChicago Argonne, LLC (Chicago, IL) ANL

Patent Number(s):: 9,008,272

Application Number:: 13/551,788

Contract Number:: AC02-06CH11357

Resource Relation:: Patent File Date: 2012 Jul 18

Research Org:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

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Other works cited in this record:

Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
patent, February 2008

Shu, Deming; Maser, Jorg; Lai, Barry
US Patent Document 7,331,714
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/7331714

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