High precision detector robot arm system

Title: High precision detector robot arm system

Abstract

A method and high precision robot arm system are provided, for example, for X-ray nanodiffraction with an X-ray nanoprobe. The robot arm system includes duo-vertical-stages and a kinematic linkage system. A two-dimensional (2D) vertical plane ultra-precision robot arm supporting an X-ray detector provides positioning and manipulating of the X-ray detector. A vertical support for the 2D vertical plane robot arm includes spaced apart rails respectively engaging a first bearing structure and a second bearing structure carried by the 2D vertical plane robot arm.

Inventors:: Shu, Deming; Chu, Yong

Issue Date:: 2017-01-31

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1341888

Patent Number(s):: 9557282

Application Number:: 14/303,149

Assignee:: U.S. Department of Energy (Washington, DC)

Patent Classifications (CPCs):: G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS

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G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
G21K7/00 - Gamma- or X-ray microscopes

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S901/41 - Tool

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/20016 - Goniometers

G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
G21K2207/00 - Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays

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DOE Contract Number:: AC02-06CH11357

Resource Type:: Patent

Resource Relation:: Patent File Date: 2014 Jun 12

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 42 ENGINEERING

Citation Formats


                    Shu, Deming, and Chu, Yong. High precision detector robot arm system.  United States: N. p., 2017. 
        Web.

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                    Shu, Deming, & Chu, Yong. High precision detector robot arm system.  United States.

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                    Shu, Deming, and Chu, Yong. Tue .  
        "High precision detector robot arm system".  United States.  https://www.osti.gov/servlets/purl/1341888.

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@article{osti_1341888,

  title        = {High precision detector robot arm system},

  author       = {Shu, Deming and Chu, Yong},

  abstractNote = {A method and high precision robot arm system are provided, for example, for X-ray nanodiffraction with an X-ray nanoprobe. The robot arm system includes duo-vertical-stages and a kinematic linkage system. A two-dimensional (2D) vertical plane ultra-precision robot arm supporting an X-ray detector provides positioning and manipulating of the X-ray detector. A vertical support for the 2D vertical plane robot arm includes spaced apart rails respectively engaging a first bearing structure and a second bearing structure carried by the 2D vertical plane robot arm.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2017},

  month        = {1}

}

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Works referenced in this record:

Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
patent, February 2008

Shu, Deming; Maser, Jorg; Lai, Barry
US Patent Document 7,331,714
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/7331714

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Title: High precision detector robot arm system

Abstract

Citation Formats

Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument patent, February 2008

Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
patent, February 2008