Contact-independent electrical conductance measurement
Abstract
Electrical conductance measurement system including a one-dimensional semiconducting channel, with electrical conductance sensitive to electrostatic fluctuations, in a circuit for measuring channel electrical current. An electrically-conductive element is disposed at a location at which the element is capacitively coupled to the channel; a midpoint of the element aligned with about a midpoint of the channel, and connected to first and second electrically-conductive contact pads that are together in a circuit connected to apply a changing voltage across the element. The electrically-conductive contact pads are laterally spaced from the midpoint of the element by a distance of at least about three times a screening length of the element, given in SI units as (K.di-elect cons..sub.0/e.sup.2D(E.sub.F)).sup.1/2, where K is the static dielectric constant, .di-elect cons..sub.0 is the permittivity of free space, e is electron charge, and D(E.sub.F) is the density of states at the Fermi energy for the element.
- Inventors:
- Issue Date:
- Research Org.:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1340576
- Patent Number(s):
- 9551736
- Application Number:
- 13/570,556
- Assignee:
- Massachusetts Institute of Technology (Cambridge, MA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- FG02-08ER46515
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2012 Aug 09
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., and Ray, Nirat. Contact-independent electrical conductance measurement. United States: N. p., 2017.
Web.
Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., & Ray, Nirat. Contact-independent electrical conductance measurement. United States.
Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., and Ray, Nirat. Tue .
"Contact-independent electrical conductance measurement". United States. https://www.osti.gov/servlets/purl/1340576.
@article{osti_1340576,
title = {Contact-independent electrical conductance measurement},
author = {Mentzel, Tamar S. and MacLean, Kenneth and Kastner, Marc A. and Ray, Nirat},
abstractNote = {Electrical conductance measurement system including a one-dimensional semiconducting channel, with electrical conductance sensitive to electrostatic fluctuations, in a circuit for measuring channel electrical current. An electrically-conductive element is disposed at a location at which the element is capacitively coupled to the channel; a midpoint of the element aligned with about a midpoint of the channel, and connected to first and second electrically-conductive contact pads that are together in a circuit connected to apply a changing voltage across the element. The electrically-conductive contact pads are laterally spaced from the midpoint of the element by a distance of at least about three times a screening length of the element, given in SI units as (K.di-elect cons..sub.0/e.sup.2D(E.sub.F)).sup.1/2, where K is the static dielectric constant, .di-elect cons..sub.0 is the permittivity of free space, e is electron charge, and D(E.sub.F) is the density of states at the Fermi energy for the element.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}
Works referenced in this record:
Coupled-well structure for transport channel in field effect transistors
patent, December 2002
- Jain, Faquir C.; Heller, Evan
- US Patent Document 6,498,360
The Effect of Electrostatic Screening on a Nanometer Scale Electrometer
journal, January 2011
- MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A.
- Nano Letters, Vol. 11, Issue 1, p. 30-34
Measuring Charge Transport in a Thin Solid Film Using Charge Sensing
journal, March 2010
- MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A.
- Nano Letters, Vol. 10, Issue 3, p. 1037-1040
Contact-Independent Measurement of Electrical Conductance of a Thin Film with a Nanoscale Sensor
journal, October 2011
- Mentzel, Tamar S.; MacLean, Kenneth; Kastner, Marc A.
- Nano Letters, Vol. 11, Issue 10, p. 4102-4106