Methods of depositing an alpha-silicon-carbide-containing film at low temperature
Abstract
Described methods are useful for depositing a silicon carbide film including Alpha-SiC at low temperatures (e.g., below about 1400.degree. C.), and resulting multi-layer structures and devices. A method includes introducing a chlorinated hydrocarbon gas and a chlorosilicon gas into a reaction chamber, and reacting the chlorinated hydrocarbon gas with the chlorosilicon gas at a temperature of less than about 1400.degree. C. to grow the silicon carbide film. The silicon carbide film so-formed includes Alpha-SiC.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1339633
- Patent Number(s):
- 9546420
- Application Number:
- 14/452,322
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
C - CHEMISTRY C23 - COATING METALLIC MATERIAL C23C - COATING METALLIC MATERIAL
C - CHEMISTRY C30 - CRYSTAL GROWTH C30B - SINGLE-CRYSTAL-GROWTH
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Aug 05
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Habermehl, Scott D. Methods of depositing an alpha-silicon-carbide-containing film at low temperature. United States: N. p., 2017.
Web.
Habermehl, Scott D. Methods of depositing an alpha-silicon-carbide-containing film at low temperature. United States.
Habermehl, Scott D. Tue .
"Methods of depositing an alpha-silicon-carbide-containing film at low temperature". United States. https://www.osti.gov/servlets/purl/1339633.
@article{osti_1339633,
title = {Methods of depositing an alpha-silicon-carbide-containing film at low temperature},
author = {Habermehl, Scott D.},
abstractNote = {Described methods are useful for depositing a silicon carbide film including Alpha-SiC at low temperatures (e.g., below about 1400.degree. C.), and resulting multi-layer structures and devices. A method includes introducing a chlorinated hydrocarbon gas and a chlorosilicon gas into a reaction chamber, and reacting the chlorinated hydrocarbon gas with the chlorosilicon gas at a temperature of less than about 1400.degree. C. to grow the silicon carbide film. The silicon carbide film so-formed includes Alpha-SiC.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}
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Works referenced in this record:
Process for applying a protective layer to shaped carbon bodies
patent, March 1980
- Sirtl, Erhard; Rath, Heinz-Jorg
- US Patent Document 4,194,028
Synthesis of diamond powders in the gas phase
patent, February 1992
- Frenklach, Michael; Spear, Karl E.; Koba, Richard J.
- US Patent Document 5,087,434
Method for forming a silicon carbide film
patent, October 1993
- Nagasawa, Hiroyuki; Yamaguchi, Yohichi
- US Patent Document 5,254,370
Method of forming silicon carbide
patent, March 1994
- Tay, Sing-Pin; Ellul, Joseph P.
- US Patent Document 5,296,258
Method for producing a wafer with a monocrystalline silicon carbide layer
patent, December 1995
- Scholz, Christoph; Koehl, Franz; Weber, Thomas
- US Patent Document 5,471,946
Process for producing silicon carbide layers and an article
patent, December 1997
- Ivanov, Leonard Stepanovich; Chernikov, Georgy Evgenievich; Eljutin, Alexandr V.
- US Patent Document 5,698,261
Substrate processing apparatus and substrate processing method
patent, March 2002
- Yoshimura, Yuta; Miyazaki, Kei; Katayama, Kyoshige
- US Patent Document 6,354,832
Resistance random access memory devices and method of fabrication
patent, August 2008
- Li, Tingkai; Hsu, Sheng Teng; Evans, David R.
- US Patent Document 7,407,858
Toner composition
patent, March 2011
- Fields, Robert D.; Havens, Charles T.; Alexandrovich, Peter S.
- US Patent Document 7,914,963
Porous gas sensors and method of preparation thereof
patent-application, September 2005
- DeBoer, John; Lewis, Stephen Edward; Hesketh, Peter
- US Patent Application 11/094584; 20050193800
Methods of Producing Silicon Carbide Fibers, Silicon Carbide Fibers, and Articles including Same
patent-application, April 2012
- Garnier, John E.; Griffith, George W.
- US Patent Application 12/901309; 20120088088
Micromechanical properties of silicon-carbide thin films deposited using single-source chemical-vapor deposition
journal, July 2001
- Stoldt, C. R.; Fritz, M. C.; Carraro, C.
- Applied Physics Letters, Vol. 79, Issue 3, p. 347-349
Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study
journal, October 2000
- Avila, A.; Montero, I.; Galán, L.
- Journal of Applied Physics, Vol. 89, Issue 1, p. 212-216
A SiC MEMS Resonant Strain Sensor for Harsh Environment Applications
journal, April 2007
- Azevedo, Robert G.; Jones, Debbie G.; Jog, Anand V.
- IEEE Sensors Journal, Vol. 7, Issue 4, p. 568-576
Surface and interface stress effects in thin films
journal, May 1994
- Cammarata, Robert C.
- Progress in Surface Science, Vol. 46, Issue 1, p. 1-38
Origin of Compressive Residual Stress in Polycrystalline Thin Films
journal, March 2002
- Chason, E.; Sheldon, B. W.; Freund, L. B.
- Physical Review Letters, Vol. 88, Issue 15, Article No. 156103
Low Pressure Chemical Etching of Silicon by HCl / H2 Gas Mixtures
journal, January 1987
- Domínguez, C.; Pastor, G.; Dominguez, E.
- Journal of The Electrochemical Society, Vol. 134, Issue 1, p. 199-202
Low Stress Polycrystalline SiC Thin Films Suitable for MEMS Applications
journal, January 2011
- Fu, Xiao-An; Dunning, Jeremy L.; Mehregany, Mehran
- Journal of The Electrochemical Society, Vol. 158, Issue 6, p. H675-H680
Use of deposition pressure to control residual stress in polycrystalline SiC films
journal, January 2004
- Fu, Xiao-An; Jezeski, Ronald; Zorman, Christian A.
- Applied Physics Letters, Vol. 84, Issue 3, p. 341-343
Polycrystalline 3C-SiC thin films deposited by dual precursor LPCVD for MEMS applications
journal, March 2005
- Fu, Xiao-An; Dunning, Jeremy L.; Zorman, Christian A.
- Sensors and Actuators A: Physical, Vol. 119, Issue 1, p. 169-176
Thermodynamic Analysis of Blanket and Selective Epitaxy of Sic on Si and SiO2 Masked Si
journal, January 1996
- Gao, Y.; Edgar, J. H.
- MRS Proceedings, Vol. 441, Article No. 735
Refinement of the crystal structure of SiC type 6H
journal, October 1967
- Gomes de Mesquita, A. H.
- Acta Crystallographica, Vol. 23, Issue 4, p. 610-617
Formation of stress-controlled, highly textured, α-SiC thin films at 950 °C
journal, July 2012
- Habermehl, S.; Rodriguez, M.; Simmons, B.
- Journal of Applied Physics, Vol. 112, Issue 1, Article No. 013535
Stress relaxation in Si-rich silicon nitride thin films
journal, May 1998
- Habermehl, S.
- Journal of Applied Physics, Vol. 83, Issue 9, p. 4672-4677
A computational study into the origin of SiC polytypes
journal, January 1992
- Heine, V.; Cheng, C.; Needs, R. J.
- Materials Science and Engineering: B, Vol. 11, Issue 1-4, p. 55-60
Effect of Reduced Pressure on 3C-SiC Heteroepitaxial Growth on Si by CVD
journal, September 2006
- Ishida, Y.; Takahashi, T.; Okumura, H.
- Chemical Vapor Deposition, Vol. 12, Issue 8-9, p. 495-501
Control of polytype formation in silicon carbide heteroepitaxial films by pulsed-laser deposition
journal, February 2004
- Kusumori, Takeshi; Muto, Hachizo; Brito, Manuel E.
- Applied Physics Letters, Vol. 84, Issue 8, p. 1272-1274
Electronic Band Structure of SiC Polytypes: A Discussion of Theory and Experiment
journal, July 1997
- Lambrecht, W.R.L.; Limpijumnong, S.; Rashkeev, S.N.
- physica status solidi (b), Vol. 202, Issue 1, p. 5-33
A vacancy model of the heteropolytype epitaxy of SiC
journal, March 2005
- Lebedev, A. A.; Davydov, S. Yu.
- Semiconductors, Vol. 39, Issue 3, p. 277-280
Tunable in situ growth of porous cubic silicon carbide thin films via methyltrichlorosilane-based chemical vapor deposition
journal, September 2009
- Lien, Wei-Cheng; Ferralis, Nicola; Pisano, Albert P.
- Applied Physics Letters, Vol. 95, Issue 10, Article No. 101901
Residual stress characterization of polycrystalline 3C-SiC films on Si(100) deposited from methylsilane
journal, July 2009
- Liu, Fang; Carraro, Carlo; Chu, Jiaru
- Journal of Applied Physics, Vol. 106, Issue 1, Article No. 013505