Electrochemical force microscopy

Title: Electrochemical force microscopy

A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.

Inventors:: Kalinin, Sergei V.; Jesse, Stephen; Collins, Liam F.; Rodriguez, Brian J.

Issue Date:: 2017-01-10

OSTI Identifier:: 1338917

Assignee:: UT-Battelle, LLC (Oak Ridge, TN) ORNL

Patent Number(s):: 9,541,576

Application Number:: 14/810,605

Contract Number:: AC05-00OR22725

Resource Relation:: Patent File Date: 2015 Jul 28

Research Org:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

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Works referenced in this record:

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