Electrochemical force microscopy
Abstract
A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1338917
- Patent Number(s):
- 9541576
- Application Number:
- 14/810,605
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Jul 28
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
Citation Formats
Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., and Rodriguez, Brian J. Electrochemical force microscopy. United States: N. p., 2017.
Web.
Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., & Rodriguez, Brian J. Electrochemical force microscopy. United States.
Kalinin, Sergei V., Jesse, Stephen, Collins, Liam F., and Rodriguez, Brian J. Tue .
"Electrochemical force microscopy". United States. https://www.osti.gov/servlets/purl/1338917.
@article{osti_1338917,
title = {Electrochemical force microscopy},
author = {Kalinin, Sergei V. and Jesse, Stephen and Collins, Liam F. and Rodriguez, Brian J.},
abstractNote = {A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}
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