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Title: Electrochemical force microscopy

A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.
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Issue Date:
OSTI Identifier:
UT-Battelle, LLC (Oak Ridge, TN) ORNL
Patent Number(s):
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Resource Relation:
Patent File Date: 2015 Jul 28
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
Country of Publication:
United States

Other works cited in this record:

Electrochemical identification of molecules in a scanning probe microscope
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Bias-Dependent Molecular-Level Structure of Electrical Double Layer in Ionic Liquid on Graphite
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Double Layer Structure of Ionic Liquids at the Au(111) Electrode Interface: An Atomic Force Microscopy Investigation
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journal, October 2009
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