Electrochemical force microscopy

Title: Electrochemical force microscopy

A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.

Inventors:: Kalinin, Sergei V.; Jesse, Stephen; Collins, Liam F.; Rodriguez, Brian J.

Issue Date:: 2017-01-10

OSTI Identifier:: 1338917

Assignee:: UT-Battelle, LLC (Oak Ridge, TN) ORNL

Patent Number(s):: 9,541,576

Application Number:: 14/810,605

Contract Number:: AC05-00OR22725

Resource Relation:: Patent File Date: 2015 Jul 28

Research Org:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Full Text
View Full Text

Other works cited in this record:

Electrochemical identification of molecules in a scanning probe microscope
patent, February 1996

Lindsay, Stuart; Jing, Tianwei
US Patent Document 5,495,109
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/5495109

Scanning probe potentiometer
patent, December 1999

Manalis, Scott; Minne, Stephen; Quate, Calvin
US Patent Document 6,002,131
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/6002131

Method for analyzing sample in liquid
patent, October 2011

Ota, Masahiro; Oyabu, Noriaki; Adachi, Hiroaki
US Patent Document 8,037,739
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/8037739

Bias-Dependent Molecular-Level Structure of Electrical Double Layer in Ionic Liquid on Graphite
journal, November 2013

Black, Jennifer M.; Walters, Deron; Labuda, Aleksander
Nano Letters, Vol. 13, Issue 12, p. 5954-5960
DOI: 10.1021/nl4031083

Double Layer Structure of Ionic Liquids at the Au(111) Electrode Interface: An Atomic Force Microscopy Investigation
journal, March 2011

Hayes, Robert; Borisenko, Natalia; Tam, Matthew K.
The Journal of Physical Chemistry C, Vol. 115, Issue 14, p. 6855-6863
DOI: 10.1021/jp200544b

Atomic force microscopy of local compliance at solid—liquid interfaces
journal, June 1994

O'Shea, S. J.; Welland, M. E.; Pethica, J. B.
Chemical Physics Letters, Vol. 223, Issue 4, p. 336-340
DOI: 10.1016/0009-2614(94)00458-7

In situ electrochemical studies of lithium-ion battery cathodes using atomic force microscopy
journal, March 2014

Ramdon, Sanjay; Bhushan, Bharat; Nagpure, Shrikant C.
Journal of Power Sources, Vol. 249, p. 373-384
DOI: 10.1016/j.jpowsour.2013.10.099

Time Resolved in Situ Liquid Atomic Force Microscopy and Simultaneous Acoustic Impedance Electrochemical Quartz Crystal Microbalance Measurements: A Study of Zn Deposition
journal, October 2009

Smith, Emma L.; Barron, John C.; Abbott, Andrew P.
Analytical Chemistry, Vol. 81, Issue 20, p. 8466-8471
DOI: 10.1021/ac901329e

Similar records in DOepatents and OSTI.GOV collections:

Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits

Patent Campbell, Ann. N. ; Anderson, Richard E. ; Cole, Jr., Edward I.

A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits.
Full Text Available January 1995
Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

Patent Hu, Jun ; Ogletree, D. Frank ; Salmeron, Miguel ; Xiao, Xudong

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.
Full Text Available January 1998
Method for imaging liquid and dielectric materials with scanning polarization force microscopy

Patent Hu, Jun ; Ogletree, D. Frank ; Salmeron, Miguel ; Xiao, Xudong

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.
Full Text Available January 1999
Mode synthesizing atomic force microscopy and mode-synthesizing sensing

Patent Passian, Ali ; Thundat, Thomas George ; Tetard, Laurene

A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
Full Text Available May 2013
Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

Patent Passain, Ali ; Thundat, Thomas George ; Tetard, Laurene

A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
Full Text Available July 2014