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Title: Band excitation method applicable to scanning probe microscopy

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.
Inventors:
;
Issue Date:
OSTI Identifier:
1338057
Assignee:
UT-Battelle, LLC (Oak Ridge, TN) ORNL
Patent Number(s):
9,535,087
Application Number:
14/752,387
Contract Number:
AC05-00OR22725
Resource Relation:
Patent File Date: 2015 Jun 26
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Works referenced in this record: