Band excitation method applicable to scanning probe microscopy

Title: Band excitation method applicable to scanning probe microscopy

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

Inventors:: Jesse, Stephen; Kalinin, Sergei V.

Issue Date:: 2017-01-03

OSTI Identifier:: 1338057

Assignee:: UT-Battelle, LLC (Oak Ridge, TN) ORNL

Patent Number(s):: 9,535,087

Application Number:: 14/752,387

Contract Number:: AC05-00OR22725

Resource Relation:: Patent File Date: 2015 Jun 26

Research Org:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

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Band excitation method applicable to scanning probe microscopy
patent, August 2010

Jesse, Stephen; Kalinin, Sergei
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Band excitation method applicable to scanning probe microscopy
patent, May 2013

Jesse, Stephen; Kalinin, Sergei
US Patent Document 8,448,502
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/8448502

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