Band excitation method applicable to scanning probe microscopy

Title: Band excitation method applicable to scanning probe microscopy

Abstract

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

Inventors:: Jesse, Stephen; Kalinin, Sergei V.

Issue Date:: 2017-01-03

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1338057

Patent Number(s):: 9,535,087

Application Number:: 14/752,387

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

DOE Contract Number:: AC05-00OR22725

Resource Type:: Patent

Resource Relation:: Patent File Date: 2015 Jun 26

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats


                    Jesse, Stephen, and Kalinin, Sergei V. Band excitation method applicable to scanning probe microscopy.  United States: N. p., 2017. 
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                    Jesse, Stephen, & Kalinin, Sergei V. Band excitation method applicable to scanning probe microscopy.  United States.

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                    Jesse, Stephen, and Kalinin, Sergei V. Tue .  
        "Band excitation method applicable to scanning probe microscopy".  United States.  https://www.osti.gov/servlets/purl/1338057.

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@article{osti_1338057,

  title        = {Band excitation method applicable to scanning probe microscopy},

  author       = {Jesse, Stephen and Kalinin, Sergei V.},

  abstractNote = {Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2017},

  month        = {1}

}

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Band excitation method applicable to scanning probe microscopy
patent, August 2010

Jesse, Stephen; Kalinin, Sergei
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Band excitation method applicable to scanning probe microscopy
patent, May 2013

Jesse, Stephen; Kalinin, Sergei
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Title: Band excitation method applicable to scanning probe microscopy

Abstract

Citation Formats

Drift compensation for scanning probe microscopes using an enhanced probe positioning system patent, December 1991

Double cantilever sensor for atomic force microscope patent, December 1993

Methods of operating atomic force microscopes to measure friction patent, September 1996

Resonance contact scanning force microscope patent, October 1997

Cantilever deflection sensor and use thereof patent, September 1998

Scanning probe microscope with scan correction patent, May 2000

Differential force microscope patent, July 2000

Sampling scanning probe microscope and sampling method thereof patent, August 2000

Scanning force microscope with high-frequency cantilever patent, November 2000

Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode patent, February 2001

Method of producing magnetic force image and scanning probe microscope August 2001

Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope patent, December 2002

Probe device patent, July 2007

Scanning probe microscope patent, July 2008

Band excitation method applicable to scanning probe microscopy patent, August 2010

Band excitation method applicable to scanning probe microscopy patent, May 2013

Drift compensation for scanning probe microscopes using an enhanced probe positioning system
patent, December 1991

Double cantilever sensor for atomic force microscope
patent, December 1993

Methods of operating atomic force microscopes to measure friction
patent, September 1996

Resonance contact scanning force microscope
patent, October 1997

Cantilever deflection sensor and use thereof
patent, September 1998

Scanning probe microscope with scan correction
patent, May 2000

Differential force microscope
patent, July 2000

Sampling scanning probe microscope and sampling method thereof
patent, August 2000

Scanning force microscope with high-frequency cantilever
patent, November 2000

Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode
patent, February 2001

Method of producing magnetic force image and scanning probe microscope
August 2001

Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope
patent, December 2002

Probe device
patent, July 2007

Scanning probe microscope
patent, July 2008

Band excitation method applicable to scanning probe microscopy
patent, August 2010

Band excitation method applicable to scanning probe microscopy
patent, May 2013