Beam imaging sensor and method for using same
Abstract
The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1338056
- Patent Number(s):
- 9535100
- Application Number:
- 14/595,593
- Assignee:
- BWXT Nuclear Operations Group, Inc. (Lynchburg, VA
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B23 - MACHINE TOOLS B23K - SOLDERING OR UNSOLDERING
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC11-07PN38361
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Jan 13
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Citation Formats
McAninch, Michael D., and Root, Jeffrey J. Beam imaging sensor and method for using same. United States: N. p., 2017.
Web.
McAninch, Michael D., & Root, Jeffrey J. Beam imaging sensor and method for using same. United States.
McAninch, Michael D., and Root, Jeffrey J. Tue .
"Beam imaging sensor and method for using same". United States. https://www.osti.gov/servlets/purl/1338056.
@article{osti_1338056,
title = {Beam imaging sensor and method for using same},
author = {McAninch, Michael D. and Root, Jeffrey J.},
abstractNote = {The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}
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