Beam imaging sensor and method for using same

McAninch, Michael D.; Root, Jeffrey J.

Title: Beam imaging sensor and method for using same

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Abstract

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.

Inventors:: McAninch, Michael D.; Root, Jeffrey J.

Issue Date:: 2017-01-03

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1338056

Patent Number(s):: 9535100

Application Number:: 14/595,593

Assignee:: BWXT Nuclear Operations Group, Inc. (Lynchburg, VA

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/3104 - Welding
H01J2237/24405 - Faraday cages

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R19/0061 - {Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J37/244 - Detectors

B - PERFORMING OPERATIONS B23 - MACHINE TOOLS B23K - SOLDERING OR UNSOLDERING
B23K15/0026 - {Auxiliary equipment}

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/24507 - Intensity, dose or other characteristics of particle beams or electromagnetic radiation

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DOE Contract Number:: AC11-07PN38361

Resource Type:: Patent

Resource Relation:: Patent File Date: 2015 Jan 13

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats


                    McAninch, Michael D., and Root, Jeffrey J. Beam imaging sensor and method for using same.  United States: N. p., 2017. 
        Web.

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                    McAninch, Michael D., & Root, Jeffrey J. Beam imaging sensor and method for using same.  United States.

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                    McAninch, Michael D., and Root, Jeffrey J. Tue .  
        "Beam imaging sensor and method for using same".  United States.  https://www.osti.gov/servlets/purl/1338056.

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@article{osti_1338056,

  title        = {Beam imaging sensor and method for using same},

  author       = {McAninch, Michael D. and Root, Jeffrey J.},

  abstractNote = {The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2017},

  month        = {1}

}

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