X-ray monitoring optical elements
Abstract
An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1337631
- Patent Number(s):
- 9529098
- Application Number:
- 14/041,831
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2013 Sep 30
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE
Citation Formats
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. X-ray monitoring optical elements. United States: N. p., 2016.
Web.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., & Terentyev, Sergey A. X-ray monitoring optical elements. United States.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. Tue .
"X-ray monitoring optical elements". United States. https://www.osti.gov/servlets/purl/1337631.
@article{osti_1337631,
title = {X-ray monitoring optical elements},
author = {Stoupin, Stanislav and Shvydko, Yury and Katsoudas, John and Blank, Vladimir D. and Terentyev, Sergey A.},
abstractNote = {An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {12}
}
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Works referenced in this record:
The characterization of x‐ray photocathodes in the 0.1–10‐keV photon energy region
journal, March 1981
- Henke, B. . L.; Knauer, J. P.; Premaratne, K.
- Journal of Applied Physics, Vol. 52, Issue 3
Double‐crystal, vacuum x‐ray diffractometer
journal, December 1977
- Kikuta, S.; Takahashi, T.; Tuzi, Y.
- Review of Scientific Instruments, Vol. 48, Issue 12
Synchrotron‐radiation‐excited etching and total electron yield measurement of silicon and silicon nitride
journal, September 1995
- Kitamura, Osamu; Terakado, Shingo; Suzuki, Shigeo
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 13, Issue 5
Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines
journal, March 2013
- Kummer, K.; Fondacaro, A.; Yakhou-Harris, F.
- Review of Scientific Instruments, Vol. 84, Issue 3
Characterization of top-quality type IIa synthetic diamonds for new X-ray optics
journal, May 2011
- Polyakov, S. N.; Denisov, V. N.; Kuzmin, N. V.
- Diamond and Related Materials, Vol. 20, Issue 5-6, p. 726-728
Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces
journal, January 1999
- Powell, C. J.; Jablonski, A.
- Journal of Physical and Chemical Reference Data, Vol. 28, Issue 1
External photoelectric effect and high-efficiency photocathodes in the soft-x-ray region of the spectrum
journal, September 1997
- Shchemelev, V. N.; Savinov, E. P.; Shchemelev, V. V.
- Physics of the Solid State, Vol. 39, Issue 9
Secondary electron emission from diamond surfaces
journal, August 1997
- Shih, A.; Yater, J.; Pehrsson, P.
- Journal of Applied Physics, Vol. 82, Issue 4
Diamond crystal optics for self-seeding of hard X-rays in X-ray free-electron lasers
journal, March 2013
- Stoupin, S.; Blank, V. D.; Terentyev, S. A.
- Diamond and Related Materials, Vol. 33, p. 1-4
Specimen charging in X-ray absorption spectroscopy: correction of total electron yield data from stabilized zirconia in the energy range 250–915 eV
journal, February 2005
- Vlachos, Dimitrios; Craven, Alan J.; McComb, David W.
- Journal of Synchrotron Radiation, Vol. 12, Issue 2