X-ray monitoring optical elements

Title: X-ray monitoring optical elements

An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.

Inventors:: Stoupin, Stanislav; Shvydko, Yury; Katsoudas, John; Blank, Vladimir D.; Terentyev, Sergey A.

Issue Date:: 2016-12-27

OSTI Identifier:: 1337631

Assignee:: UChicago Argonne, LLC (Chicago, IL) ANL

Patent Number(s):: 9,529,098

Application Number:: 14/041,831

Contract Number:: AC02-06CH11357

Resource Relation:: Patent File Date: 2013 Sep 30

Research Org:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

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Other works cited in this record:

Characterization of top-quality type IIa synthetic diamonds for new X-ray optics
journal, May 2011

Polyakov, S. N.; Denisov, V. N.; Kuzmin, N. V.
Diamond and Related Materials, Vol. 20, Issue 5-6, p. 726-728
DOI: 10.1016/j.diamond.2011.03.012

Diamond crystal optics for self-seeding of hard X-rays in X-ray free-electron lasers
journal, March 2013

Stoupin, S.; Blank, V. D.; Terentyev, S. A.
Diamond and Related Materials, Vol. 33, p. 1-4
DOI: 10.1016/j.diamond.2012.12.009

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