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Title: X-ray monitoring optical elements

An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.
Inventors:
; ; ; ;
Issue Date:
OSTI Identifier:
1337631
Assignee:
UChicago Argonne, LLC (Chicago, IL) ANL
Patent Number(s):
9,529,098
Application Number:
14/041,831
Contract Number:
AC02-06CH11357
Resource Relation:
Patent File Date: 2013 Sep 30
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Works referenced in this record:

Characterization of top-quality type IIa synthetic diamonds for new X-ray optics
journal, May 2011
  • Polyakov, S. N.; Denisov, V. N.; Kuzmin, N. V.
  • Diamond and Related Materials, Vol. 20, Issue 5-6, p. 726-728
  • DOI: 10.1016/j.diamond.2011.03.012

Diamond crystal optics for self-seeding of hard X-rays in X-ray free-electron lasers
journal, March 2013