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Title: X-ray monitoring optical elements

Abstract

An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1337631
Patent Number(s):
9529098
Application Number:
14/041,831
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Sep 30
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Citation Formats

Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. X-ray monitoring optical elements. United States: N. p., 2016. Web.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., & Terentyev, Sergey A. X-ray monitoring optical elements. United States.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. Tue . "X-ray monitoring optical elements". United States. https://www.osti.gov/servlets/purl/1337631.
@article{osti_1337631,
title = {X-ray monitoring optical elements},
author = {Stoupin, Stanislav and Shvydko, Yury and Katsoudas, John and Blank, Vladimir D. and Terentyev, Sergey A.},
abstractNote = {An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {12}
}

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Works referenced in this record:

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