X-ray monitoring optical elements
Abstract
An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1337631
- Patent Number(s):
- 9,529,098
- Application Number:
- 14/041,831
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2013 Sep 30
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE
Citation Formats
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. X-ray monitoring optical elements. United States: N. p., 2016.
Web.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., & Terentyev, Sergey A. X-ray monitoring optical elements. United States.
Stoupin, Stanislav, Shvydko, Yury, Katsoudas, John, Blank, Vladimir D., and Terentyev, Sergey A. Tue .
"X-ray monitoring optical elements". United States. https://www.osti.gov/servlets/purl/1337631.
@article{osti_1337631,
title = {X-ray monitoring optical elements},
author = {Stoupin, Stanislav and Shvydko, Yury and Katsoudas, John and Blank, Vladimir D. and Terentyev, Sergey A.},
abstractNote = {An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {12}
}
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