High speed high dynamic range high accuracy measurement system
Abstract
A measuring system includes an input that emulates a bandpass filter with no signal reflections. A directional coupler connected to the input passes the filtered input to electrically isolated measuring circuits. Each of the measuring circuits includes an amplifier that amplifies the signal through logarithmic functions. The output of the measuring system is an accurate high dynamic range measurement.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1333732
- Patent Number(s):
- 9506953
- Application Number:
- 13/744,123
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2013 Jan 17
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Deibele, Craig E., Curry, Douglas E., Dickson, Richard W., and Xie, Zaipeng. High speed high dynamic range high accuracy measurement system. United States: N. p., 2016.
Web.
Deibele, Craig E., Curry, Douglas E., Dickson, Richard W., & Xie, Zaipeng. High speed high dynamic range high accuracy measurement system. United States.
Deibele, Craig E., Curry, Douglas E., Dickson, Richard W., and Xie, Zaipeng. Tue .
"High speed high dynamic range high accuracy measurement system". United States. https://www.osti.gov/servlets/purl/1333732.
@article{osti_1333732,
title = {High speed high dynamic range high accuracy measurement system},
author = {Deibele, Craig E. and Curry, Douglas E. and Dickson, Richard W. and Xie, Zaipeng},
abstractNote = {A measuring system includes an input that emulates a bandpass filter with no signal reflections. A directional coupler connected to the input passes the filtered input to electrically isolated measuring circuits. Each of the measuring circuits includes an amplifier that amplifies the signal through logarithmic functions. The output of the measuring system is an accurate high dynamic range measurement.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {11}
}
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Works referenced in this record:
Apparatus for measuring impedance of a resonant structure
patent, May 2001
- Lonsdale, Anthony; Lonsdale, Bryan
- US Patent Document 6,237,417
Methods and apparatus for calibrating temperature measurements and measuring currents
patent, August 2001
- Blau, David A.; Jadushlever, Elia
- US Patent Document 6,280,081