Method, apparatus and system to compensate for drift by physically unclonable function circuitry
Abstract
Techniques and mechanisms to detect and compensate for drift by a physically uncloneable function (PUF) circuit. In an embodiment, first state information is registered as reference information to be made available for subsequent evaluation of whether drift by PUF circuitry has occurred. The first state information is associated with a first error correction strength. The first state information is generated based on a first PUF value output by the PUF circuitry. In another embodiment, second state information is determined based on a second PUF value that is output by the PUF circuitry. An evaluation of whether drift has occurred is performed based on the first state information and the second state information, the evaluation including determining whether a threshold error correction strength is exceeded concurrent with a magnitude of error being less than the first error correction strength.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1333217
- Patent Number(s):
- 9501664
- Application Number:
- 14/570,704
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
H - ELECTRICITY H04 - ELECTRIC COMMUNICATION TECHNIQUE H04L - TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Dec 15
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING
Citation Formats
Hamlet, Jason. Method, apparatus and system to compensate for drift by physically unclonable function circuitry. United States: N. p., 2016.
Web.
Hamlet, Jason. Method, apparatus and system to compensate for drift by physically unclonable function circuitry. United States.
Hamlet, Jason. Tue .
"Method, apparatus and system to compensate for drift by physically unclonable function circuitry". United States. https://www.osti.gov/servlets/purl/1333217.
@article{osti_1333217,
title = {Method, apparatus and system to compensate for drift by physically unclonable function circuitry},
author = {Hamlet, Jason},
abstractNote = {Techniques and mechanisms to detect and compensate for drift by a physically uncloneable function (PUF) circuit. In an embodiment, first state information is registered as reference information to be made available for subsequent evaluation of whether drift by PUF circuitry has occurred. The first state information is associated with a first error correction strength. The first state information is generated based on a first PUF value output by the PUF circuitry. In another embodiment, second state information is determined based on a second PUF value that is output by the PUF circuitry. An evaluation of whether drift has occurred is performed based on the first state information and the second state information, the evaluation including determining whether a threshold error correction strength is exceeded concurrent with a magnitude of error being less than the first error correction strength.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {11}
}
Works referenced in this record:
Reconfigurable trusted computing in hardware
conference, January 2007
- Eisenbarth, Thomas; Güneysu, Tim; Paar, Christof
- Proceedings of the 2007 ACM workshop on Scalable trusted computing - STC '07
Anti-counterfeiting, key distribution, and key storage in an ambient world via physical unclonable functions
journal, October 2008
- Guajardo, Jorge; Škorić, Boris; Tuyls, Pim
- Information Systems Frontiers, Vol. 11, Issue 1
Dynamic Intellectual Property Protection for Reconfigurable Devices
conference, December 2007
- Guneysu, Tim; Moller, Bodo; Paar, Christof
- 2007 International Conference on Field-Programmable Technology
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
journal, September 2009
- Holcomb, D. E.; Burleson, W. P.; Fu, K.
- IEEE Transactions on Computers, Vol. 58, Issue 9
Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
journal, November 2005
- Borkar, S.
- IEEE Micro, Vol. 25, Issue 6
Electronics beyond nano-scale CMOS
conference, January 2006
- Borkar, Shekhar
- Proceedings of the 43rd annual conference on Design automation - DAC '06
Dynamic NBTI of PMOS transistors and its impact on device lifetime
conference, January 2003
- Chen, G.; Chuah, K. Y.; Li, M. F.
- 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
Reliability challenges for 45nm and beyond
conference, January 2006
- McPherson, J. W.
- Proceedings of the 43rd annual conference on Design automation - DAC '06
Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
journal, July 2003
- Schroder, Dieter K.; Babcock, Jeff A.
- Journal of Applied Physics, Vol. 94, Issue 1
Temperature-aware NBTI modeling and the impact of input vector control on performance degradation
conference, April 2007
- Wang, Yu; Luo, Hong; He, Ku
- 2007 Design, Automation & Test in Europe Conference & Exhibition
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
conference, March 2008
- Zhang, Bin; Orshansky, Michael
- 2008 9th International Symposium of Quality of Electronic Design (ISQED), 9th International Symposium on Quality Electronic Design (isqed 2008)
Circuit aging prediction for low-power operation
conference, September 2009
- Zheng, Rui; Velamala, Jyothi; Reddy, Vijay
- 2009 IEEE Custom Integrated Circuits Conference (CICC)
A Digital 1.6 pJ/bit Chip Identification Circuit Using Process Variations
journal, January 2008
- Su, Ying; Holleman, Jeremy; Otis, Brian P.
- IEEE Journal of Solid-State Circuits, Vol. 43, Issue 1
A technique to build a secret key in integrated circuits for identification and authentication applications
conference, January 2004
- Lee, J. W.; Gassend, B.
- 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525)
Energy Scalable Universal Hashing
journal, December 2005
- Kaps, J.; Yuksel, K.; Sunar, B.
- IEEE Transactions on Computers, Vol. 54, Issue 12
Extended abstract: The butterfly PUF protecting IP on every FPGA
conference, June 2008
- Kumar, Sandeep S.; Guajardo, Jorge; Maes, Roel
- 2008 IEEE International Workshop on Hardware-Oriented Security and Trust (HOST)
LFSR-based Hashing and Authentication
conference, January 1994
- Krawczyk, Hugo; Desmedt, Yvo G.
- Advances in Cryptology — CRYPTO ’94, p. 129-139
Physical unclonable functions for device authentication and secret key generation
conference, January 2007
- Suh, G. Edward; Devadas, Srinivas
- Proceedings of the 44th annual conference on Design automation - DAC '07
Physical Unclonable Functions and Public-Key Crypto for FPGA IP Protection
conference, August 2007
- Guajardo, Jorge; Kumar, Sandeep S.; Schrijen, Geert-Jan
- 2007 International Conference on Field Programmable Logic and Applications
Silicon physical random functions
conference, January 2002
- Gassend, Blaise; Clarke, Dwaine; van Dijk, Marten
- Proceedings of the 9th ACM conference on Computer and communications security - CCS '02
Protecting bus-based hardware IP by secret sharing
conference, January 2008
- Roy, Jarrod A.; Koushanfar, Farinaz; Markov, Igor L.
- Proceedings of the 45th annual conference on Design automation - DAC '08
A physical unclonable function defined using power distribution system equivalent resistance variations
conference, January 2009
- Helinski, Ryan; Acharyya, Dhruva; Plusquellic, Jim
- Proceedings of the 46th Annual Design Automation Conference on ZZZ - DAC '09
IC identification circuit using device mismatch
conference, January 2000
- Lofstrom, K.; Daasch, W. R.; Taylor, D.
- 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056)
Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system
conference, January 2010
- Helinski, Ryan; Acharyya, Dhruva; Plusquellic, Jim
- Proceedings of the 47th Design Automation Conference on - DAC '10
An artificial fingerprint device (AFD): a study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs
journal, June 2003
- Maeda, S.; Kuriyama, H.; Ipposhi, T.
- IEEE Transactions on Electron Devices, Vol. 50, Issue 6
Comb Capacitor Structures for On-Chip Physical Uncloneable Function
journal, February 2009
- Roy, Deepu; Klootwijk, Johan H.; Verhaegh, Nynke A. M.
- IEEE Transactions on Semiconductor Manufacturing, Vol. 22, Issue 1
Remote patient monitoring: Information reliability challenges
conference, October 2009
- Petkovic, Milan
- TELSIKS 2009 - 2009 9th International Conference on Telecommunications in Modern Satellite, Cable, and Broadcasting Services, 2009 9th International Conference on Telecommunication in Modern Satellite, Cable, and Broadcasting Services
LISA: Maximizing RO PUF's secret extraction
conference, June 2010
- Yin, Chi-En; Qu, Gang
- 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST 2010), 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)