Probe tip heating assembly
Abstract
A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.
- Inventors:
- Issue Date:
- Research Org.:
- Hysitron, Inc., Eden Prairie, MN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1330349
- Patent Number(s):
- 9,476,816
- Application Number:
- 14/358,065
- Assignee:
- Hysitron, Inc. (Eden Prairie, MN)
- DOE Contract Number:
- FG02-07ER84812
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2012 Nov 14
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Schmitz, Roger William, and Oh, Yunje. Probe tip heating assembly. United States: N. p., 2016.
Web.
Schmitz, Roger William, & Oh, Yunje. Probe tip heating assembly. United States.
Schmitz, Roger William, and Oh, Yunje. Tue .
"Probe tip heating assembly". United States. https://www.osti.gov/servlets/purl/1330349.
@article{osti_1330349,
title = {Probe tip heating assembly},
author = {Schmitz, Roger William and Oh, Yunje},
abstractNote = {A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {10}
}
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