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Title: Probe tip heating assembly

Abstract

A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.

Inventors:
;
Issue Date:
Research Org.:
Hysitron, Inc., Eden Prairie, MN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1330349
Patent Number(s):
9,476,816
Application Number:
14/358,065
Assignee:
Hysitron, Inc. (Eden Prairie, MN)
DOE Contract Number:  
FG02-07ER84812
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Nov 14
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Schmitz, Roger William, and Oh, Yunje. Probe tip heating assembly. United States: N. p., 2016. Web.
Schmitz, Roger William, & Oh, Yunje. Probe tip heating assembly. United States.
Schmitz, Roger William, and Oh, Yunje. Tue . "Probe tip heating assembly". United States. https://www.osti.gov/servlets/purl/1330349.
@article{osti_1330349,
title = {Probe tip heating assembly},
author = {Schmitz, Roger William and Oh, Yunje},
abstractNote = {A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {10}
}

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