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Title: Imaging, cutting, and collecting instrument and method

Abstract

Instrumentation and techniques are described to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution. This instrument and method are also used to cut-off identified parts of objects, to move around and manipulate the cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM. The plural cantilevers are used with either sharp-tips or knife-edges. In addition, the invention can be utilized for measuring the hardness of materials. 10 figs.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
University of California
OSTI Identifier:
131909
Patent Number(s):
5,461,907
Application Number:
PAN: 8-035,741
Assignee:
Univ. of California, Oakland, CA (United States)
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 31 Oct 1995
Country of Publication:
United States
Language:
English
Subject:
55 BIOLOGY AND MEDICINE, BASIC STUDIES; CHROMOSOMES; IMAGE PROCESSING; MICROSCOPES; DESIGN; HISTOLOGICAL TECHNIQUES

Citation Formats

Tench, R J, Siekhaus, W J, Balooch, M, Balhorn, R L, and Allen, M J. Imaging, cutting, and collecting instrument and method. United States: N. p., 1995. Web.
Tench, R J, Siekhaus, W J, Balooch, M, Balhorn, R L, & Allen, M J. Imaging, cutting, and collecting instrument and method. United States.
Tench, R J, Siekhaus, W J, Balooch, M, Balhorn, R L, and Allen, M J. Tue . "Imaging, cutting, and collecting instrument and method". United States.
@article{osti_131909,
title = {Imaging, cutting, and collecting instrument and method},
author = {Tench, R J and Siekhaus, W J and Balooch, M and Balhorn, R L and Allen, M J},
abstractNote = {Instrumentation and techniques are described to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution. This instrument and method are also used to cut-off identified parts of objects, to move around and manipulate the cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM. The plural cantilevers are used with either sharp-tips or knife-edges. In addition, the invention can be utilized for measuring the hardness of materials. 10 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {10}
}