Method and apparatus for wavefront sensing
Abstract
A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.
- Inventors:
- Issue Date:
- Research Org.:
- RAM PHOTONICS, LLC, San Diego, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1303529
- Patent Number(s):
- 9423306
- Application Number:
- 14/587,392
- Assignee:
- RAM PHOTONICS, LLC (San Diego, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
- DOE Contract Number:
- FC52-08NA28302
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Dec 31
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States: N. p., 2016.
Web.
Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States.
Bahk, Seung-Whan. Tue .
"Method and apparatus for wavefront sensing". United States. https://www.osti.gov/servlets/purl/1303529.
@article{osti_1303529,
title = {Method and apparatus for wavefront sensing},
author = {Bahk, Seung-Whan},
abstractNote = {A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {8}
}
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