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Title: Method and apparatus for wavefront sensing

Abstract

A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.

Inventors:
Issue Date:
Research Org.:
RAM PHOTONICS, LLC, San Diego, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1303529
Patent Number(s):
9423306
Application Number:
14/587,392
Assignee:
RAM PHOTONICS, LLC (San Diego, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES
DOE Contract Number:  
FC52-08NA28302
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Dec 31
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States: N. p., 2016. Web.
Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States.
Bahk, Seung-Whan. Tue . "Method and apparatus for wavefront sensing". United States. https://www.osti.gov/servlets/purl/1303529.
@article{osti_1303529,
title = {Method and apparatus for wavefront sensing},
author = {Bahk, Seung-Whan},
abstractNote = {A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {8}
}

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Works referenced in this record:

Generation and characterization of the highest laser intensities (1022 W/cm2)
journal, January 2004


A high-resolution, adaptive beam-shaping system for high-power lasers
journal, January 2010


Highly accurate wavefront reconstruction algorithms over broad spatial-frequency bandwidth
journal, January 2011