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Title: Beam imaging sensor

Abstract

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1260239
Patent Number(s):
9383460
Application Number:
13/826,907
Assignee:
Babcock & Wilcox Nuclear Operations Group, Inc.
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B23 - MACHINE TOOLS B23K - SOLDERING OR UNSOLDERING
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
AC11-07PN38361
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Mar 14
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS

Citation Formats

McAninch, Michael D., and Root, Jeffrey J. Beam imaging sensor. United States: N. p., 2016. Web.
McAninch, Michael D., & Root, Jeffrey J. Beam imaging sensor. United States.
McAninch, Michael D., and Root, Jeffrey J. Tue . "Beam imaging sensor". United States. https://www.osti.gov/servlets/purl/1260239.
@article{osti_1260239,
title = {Beam imaging sensor},
author = {McAninch, Michael D. and Root, Jeffrey J.},
abstractNote = {The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 05 00:00:00 EDT 2016},
month = {Tue Jul 05 00:00:00 EDT 2016}
}

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Beam Imaging Sensor
patent-application, November 2013