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Title: Beam imaging sensor

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature.
Issue Date:
OSTI Identifier:
Babcock & Wilcox Nuclear Operations Group, Inc. ORNL
Patent Number(s):
Application Number:
Contract Number:
Resource Relation:
Patent File Date: 2013 Mar 14
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
Country of Publication:
United States

Other works cited in this record:

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patent, December 2005

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patent, January 2007

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Plasma potential measuring method and apparatus, and plasma potential measuring probe
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Particle beam current measurement system
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Beam current measuring instrument and beam current measuring method using same
November 2009

Device for outputting high and/or low energy X-rays
patent, January 2010

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patent, April 2010

Irradiating device and method for controlling the same
patent, April 2010

Focusing system and method for a charged particle imaging system
patent, April 2010

Charged particle beam profile measurement
patent, January 2011

Beam current sensor
patent, February 2011

Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams
patent, March 2011

Planar type frequency shift probe for measuring plasma electron densities and method and apparatus for measuring plasma electron densities
patent, October 2011

Method for the precise measurement of dependency on amplitude and phase of plurality of high frequency signals and device for carrying out said method
patent, November 2011

Electron beam processing device
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Wide-dynamic range electrometer with a fast response
patent, October 2012

Use of beam deflection to control an electron beam wire deposition process
patent, January 2013

Integrated optical element and Faraday cup
patent, February 2013

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patent, April 2013

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patent, August 2013

Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013

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patent, December 2013

Electron beam layer manufacturing using scanning electron monitored closed loop control
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