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Title: High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.
Inventors:
; ; ; ;
Issue Date:
OSTI Identifier:
1258006
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
Patent Number(s):
9,373,479
Application Number:
14/851,692
Contract Number:
AC52-07NA27344
Resource Relation:
Patent File Date: 2015 Sep 11
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Other works cited in this record:

4D ultrafast electron microscopy: Imaging of atomic motions, acoustic resonances, and moiré fringe dynamics
journal, December 2009

Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
journal, November 2012

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
journal, October 2008

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