Dual contact pogo pin assembly
Abstract
A contact assembly includes a base and a pair of electrical contacts supported by the base. A first end of the first electrical contact corresponds to a first end of the base and is configured to engage a first external conductive circuit element. A first end of the second electrical contact also corresponds to the first end of the base and is configured to engage a second external conductive circuit element. The first contact and the second contact are electrically isolated from one another and configured to compress when engaging an external connector element. The base includes an aperture positioned on a second end of the base outboard of a second end of the first and second electrical contacts. The aperture presents a narrowing shape with a wide mouth distal the electrical contacts and a narrow internal through-hole proximate the electrical contacts.
- Inventors:
- Issue Date:
- Research Org.:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1258003
- Patent Number(s):
- 9373908
- Application Number:
- 14/539,763
- Assignee:
- Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01R - ELECTRICALLY-CONDUCTIVE CONNECTIONS
- DOE Contract Number:
- NA0000622
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Nov 12
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Hatch, Stephen McGarry. Dual contact pogo pin assembly. United States: N. p., 2016.
Web.
Hatch, Stephen McGarry. Dual contact pogo pin assembly. United States.
Hatch, Stephen McGarry. Tue .
"Dual contact pogo pin assembly". United States. https://www.osti.gov/servlets/purl/1258003.
@article{osti_1258003,
title = {Dual contact pogo pin assembly},
author = {Hatch, Stephen McGarry},
abstractNote = {A contact assembly includes a base and a pair of electrical contacts supported by the base. A first end of the first electrical contact corresponds to a first end of the base and is configured to engage a first external conductive circuit element. A first end of the second electrical contact also corresponds to the first end of the base and is configured to engage a second external conductive circuit element. The first contact and the second contact are electrically isolated from one another and configured to compress when engaging an external connector element. The base includes an aperture positioned on a second end of the base outboard of a second end of the first and second electrical contacts. The aperture presents a narrowing shape with a wide mouth distal the electrical contacts and a narrow internal through-hole proximate the electrical contacts.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {6}
}
Works referenced in this record:
Electrical zero insertion force multiconnector
patent, August 1987
- 38Havel, Karel
- US Patent Document 4,684,193
Wire-seizing connector for co-axial cable
patent, January 1990
- Dyck, Arthur
- US Patent Document 4,897,045
Contacting system for electrical devices
patent, July 1997
- Johnson, David A.
- US Patent Document 5,645,433
Connecting pin having electrically conductive magnetic fluid
patent, November 1999
- Ito, Atsushi
- US Patent Document 5,993,269
Low insertion force connector with wipe
patent, July 2001
- Shelby, Frank S.; Goodman, James
- US Patent Document 6,257,911
Fetal spiral electrode sleeve and wire interconnect system
patent, November 2001
- Dowd, Edward J.; Graumann, Robert J.; Haug, Brian Erik
- US Patent Document 6,321,103
Electrical connector
patent, November 2003
- Akram, Salman; Hembree, David R.; Farnworth, Warren M.
- US Patent Document 6,648,654
Electrical test probe provided with a signal transmitting wire having an enlarged portion for preventing the wire from coming out of the probe
patent, December 2003
- Ishikawa, Shigeki; Yamada, Yoshio
- US Patent Document 6,655,983
Contactor with isolated spring tips
patent, January 2004
- Faull, James A.
- US Patent Document 6,677,772
Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
patent, July 2005
- Mok, Sammy; Chong, Fu Chiung; Swiatowiec, Frank
- US Patent Document 6,917,525
Coaxial cable for overvoltage protection
patent, September 2005
- Parrish, Frank; Behziz, Arash; Castellano, Derek
- US Patent Document 6,939,175
High speed, high density interconnect system for differential and single-ended transmission systems
patent, June 2006
- Driscoll, Michael P.; Vetter, Stephen; Bradley, Robert M.
- US Patent Document 7,056,128
Pusher of IC chip handler
patent, May 2007
- Hayashi, Shintaro; Urakawa, Osamu; Koizumi, Mitsuo
- US Patent Document 7,214,072
Spring-based probe pin that allows kelvin testing
patent, September 2007
- Tang, Tze Kang; Chong, Sek Hoi; Gan, Chin Chai
- US Patent Document 7,271,606
Cable connector assembly with status indicator means
patent, September 2008
- Wu, Jerry
- US Patent Document 7,429,188
Connector assembly with improved solder tails
patent, June 2010
- Ko, David (Tso-Chin)
- US Patent Document 7,736,156
Probe connector having a mounting platform
patent, October 2010
- Lin, Ming-Han; Yin, Te-Hung
- US Patent Document 7,815,474
Pogo pin, the fabrication method thereof and test socket using the same
patent, April 2011
- Chung, Un-Young
- US Patent Document 7,922,544
Audio jack with pogo pins for conductive contacts
patent, May 2011
- Murphy, Sean; DiFonzo, John C.
- US Patent Document 7,942,705
Testing apparatus for integrated circuit
patent, August 2012
- Washio, Kenichi; Hasegawa, Masashi
- US Patent Document 8,253,433
Electrical device with contact assembly
patent, October 2012
- Christ, Johannes; Russo, Stefan Luigi
- US Patent Document 8,277,231
Probe unit
patent, January 2013
- Kazama, Toshio; Hironaka, Kohei; Ishikawa, Shigeki
- US Patent Document 8,344,747
Semiconductor device and method for manufacturing the same
patent, May 2013
- Shibuya, Akinobu; Tsuchiya, Katsuyoshi; Imaizumi, Akira
- US Patent Document 8,445,295
Electrical connecting apparatus and testing system using the same
patent, September 2013
- Washio, Kenichi; Hasegawa, Masashi
- US Patent Document 8,525,539
Micro positioning test socket and methods for active precision alignment and co-planarity feedback
patent, April 2014
- Detofsky, Abram M.; Albertson, Todd P.; Shia, David
- US Patent Document 8,710,858
Contact probe and socket
patent, May 2014
- Yamamoto, Tsugio; Todoroki, Takeshi
- US Patent Document 8,723,540