Methods for resistive switching of memristors
Abstract
The present invention is directed generally to resistive random-access memory (RRAM or ReRAM) devices and systems, as well as methods of employing a thermal resistive model to understand and determine switching of such devices. In particular example, the method includes generating a power-resistance measurement for the memristor device and applying an isothermal model to the power-resistance measurement in order to determine one or more parameters of the device (e.g., filament state).
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1252204
- Patent Number(s):
- 9336870
- Application Number:
- 14/612,958
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G11 - INFORMATION STORAGE G11C - STATIC STORES
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Feb 03
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Mickel, Patrick R., James, Conrad D., Lohn, Andrew, Marinella, Matthew, and Hsia, Alexander H. Methods for resistive switching of memristors. United States: N. p., 2016.
Web.
Mickel, Patrick R., James, Conrad D., Lohn, Andrew, Marinella, Matthew, & Hsia, Alexander H. Methods for resistive switching of memristors. United States.
Mickel, Patrick R., James, Conrad D., Lohn, Andrew, Marinella, Matthew, and Hsia, Alexander H. Tue .
"Methods for resistive switching of memristors". United States. https://www.osti.gov/servlets/purl/1252204.
@article{osti_1252204,
title = {Methods for resistive switching of memristors},
author = {Mickel, Patrick R. and James, Conrad D. and Lohn, Andrew and Marinella, Matthew and Hsia, Alexander H.},
abstractNote = {The present invention is directed generally to resistive random-access memory (RRAM or ReRAM) devices and systems, as well as methods of employing a thermal resistive model to understand and determine switching of such devices. In particular example, the method includes generating a power-resistance measurement for the memristor device and applying an isothermal model to the power-resistance measurement in order to determine one or more parameters of the device (e.g., filament state).},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 10 00:00:00 EDT 2016},
month = {Tue May 10 00:00:00 EDT 2016}
}
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