Electronic interconnects and devices with topological surface states and methods for fabricating same

Title: Electronic interconnects and devices with topological surface states and methods for fabricating same

An interconnect is disclosed with enhanced immunity of electrical conductivity to defects. The interconnect includes a material with charge carriers having topological surface states. Also disclosed is a method for fabricating such interconnects. Also disclosed is an integrated circuit including such interconnects. Also disclosed is a gated electronic device including a material with charge carriers having topological surface states.

Inventors:: Yazdani, Ali; Ong, N. Phuan; Cava, Robert J.

Issue Date:: 2016-05-03

OSTI Identifier:: 1250439

Assignee:: Princeton University (Princeton, NJ) CHO

Patent Number(s):: 9,331,020

Application Number:: 13/039,762

Contract Number:: FG02-07ER46419

Resource Relation:: Patent File Date: 2011 Mar 03

Research Org:: Princeton University, Princeton, NJ (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 42 ENGINEERING

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