Scanning measurement of Seebeck coefficient of a heated sample
Abstract
A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.
- Inventors:
- Issue Date:
- Research Org.:
- California Institute of Technology (CalTech), Pasadena, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1247997
- Patent Number(s):
- 9316545
- Application Number:
- 13/547,006
- Assignee:
- California Institute of Technology (Pasadena, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AR0000033
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2012 Jul 11
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Snyder, G. Jeffrey, and Iwanaga, Shiho. Scanning measurement of Seebeck coefficient of a heated sample. United States: N. p., 2016.
Web.
Snyder, G. Jeffrey, & Iwanaga, Shiho. Scanning measurement of Seebeck coefficient of a heated sample. United States.
Snyder, G. Jeffrey, and Iwanaga, Shiho. Tue .
"Scanning measurement of Seebeck coefficient of a heated sample". United States. https://www.osti.gov/servlets/purl/1247997.
@article{osti_1247997,
title = {Scanning measurement of Seebeck coefficient of a heated sample},
author = {Snyder, G. Jeffrey and Iwanaga, Shiho},
abstractNote = {A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {4}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
An automated microprobe for temperature dependent spatial scanning of the Seebeck coefficient
conference, January 2003
- Platzek, D.; Zuber, A.; Stiewe, C.
- Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726)
Measurement of Seebeck coefficient using a light pulse
journal, May 1985
- Wood, C.; Zoltan, D.; Stapfer, G.
- Review of Scientific Instruments, Vol. 56, Issue 5
High temperature Seebeck coefficient metrology
journal, December 2010
- Martin, J.; Tritt, T.; Uher, C.
- Journal of Applied Physics, Vol. 108, Issue 12, Article No. 121101
Measurement of Seebeck coefficient using a large thermal gradient
journal, June 1988
- Wood, C.; Chmielewski, A.; Zoltan, D.
- Review of Scientific Instruments, Vol. 59, Issue 6, p. 951-954
Potential-Seebeck-microprobe (PSM): measuring the spatial resolution of the Seebeck coefficient and the electric potential
conference, January 2005
- Platzek, D.; Karpinski, G.; Stiewe, C.
- ICT 2005. 24th International Conference on Thermoelectrics, 2005.
Rapid manufacturing system for metal, metal matrix composite materials and ceramics
patent, October 2002
- Rabinovich, Joshua E.
- US Patent Document 6,459,069
Probe apparatus and method for measuring thermoelectric properties of materials
patent, October 2002
- Ghoshal, Uttam Shyamalindu
- US Patent Document 6,467,951