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Title: Scanning measurement of Seebeck coefficient of a heated sample

Abstract

A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.

Inventors:
;
Issue Date:
Research Org.:
California Institute of Technology (CalTech), Pasadena, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1247997
Patent Number(s):
9,316,545
Application Number:
13/547,006
Assignee:
California Institute of Technology (Pasadena, CA)
DOE Contract Number:  
AR0000033
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Jul 11
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Snyder, G. Jeffrey, and Iwanaga, Shiho. Scanning measurement of Seebeck coefficient of a heated sample. United States: N. p., 2016. Web.
Snyder, G. Jeffrey, & Iwanaga, Shiho. Scanning measurement of Seebeck coefficient of a heated sample. United States.
Snyder, G. Jeffrey, and Iwanaga, Shiho. Tue . "Scanning measurement of Seebeck coefficient of a heated sample". United States. https://www.osti.gov/servlets/purl/1247997.
@article{osti_1247997,
title = {Scanning measurement of Seebeck coefficient of a heated sample},
author = {Snyder, G. Jeffrey and Iwanaga, Shiho},
abstractNote = {A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {4}
}

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Works referenced in this record:

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