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Title: Scanning measurement of Seebeck coefficient of a heated sample

A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.
Inventors:
;
Issue Date:
OSTI Identifier:
1247997
Assignee:
California Institute of Technology (Pasadena, CA) ARPA-E
Patent Number(s):
9,316,545
Application Number:
13/547,006
Contract Number:
AR0000033
Resource Relation:
Patent File Date: 2012 Jul 11
Research Org:
California Institute of Technology, Pasadena, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Works referenced in this record:

High temperature Seebeck coefficient metrology
journal, December 2010
  • Martin, J.; Tritt, T.; Uher, C.
  • Journal of Applied Physics, Vol. 108, Issue 12, Article No. 121101
  • DOI: 10.1063/1.3503505

Measurement of Seebeck coefficient using a large thermal gradient
journal, June 1988
  • Wood, C.; Chmielewski, A.; Zoltan, D.
  • Review of Scientific Instruments, Vol. 59, Issue 6, p. 951-954
  • DOI: 10.1063/1.1139756