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Title: Ordered organic-organic multilayer growth

Abstract

An ordered multilayer crystalline organic thin film structure is formed by depositing at least two layers of thin film crystalline organic materials successively wherein the at least two thin film layers are selected to have their surface energies within .+-.50% of each other, and preferably within .+-.15% of each other, whereby every thin film layer within the multilayer crystalline organic thin film structure exhibit a quasi-epitaxial relationship with the adjacent crystalline organic thin film.

Inventors:
;
Issue Date:
Research Org.:
Univ. of Michigan, Ann Arbor, MI (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1245409
Patent Number(s):
9306184
Application Number:
14/578,522
Assignee:
The Regents of the University of Michigan (Ann Arbor, MI)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
DOE Contract Number:  
FG36-08GO18022
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Dec 22
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Forrest, Stephen R., and Lunt, Richard R. Ordered organic-organic multilayer growth. United States: N. p., 2016. Web.
Forrest, Stephen R., & Lunt, Richard R. Ordered organic-organic multilayer growth. United States.
Forrest, Stephen R., and Lunt, Richard R. Tue . "Ordered organic-organic multilayer growth". United States. https://www.osti.gov/servlets/purl/1245409.
@article{osti_1245409,
title = {Ordered organic-organic multilayer growth},
author = {Forrest, Stephen R. and Lunt, Richard R.},
abstractNote = {An ordered multilayer crystalline organic thin film structure is formed by depositing at least two layers of thin film crystalline organic materials successively wherein the at least two thin film layers are selected to have their surface energies within .+-.50% of each other, and preferably within .+-.15% of each other, whereby every thin film layer within the multilayer crystalline organic thin film structure exhibit a quasi-epitaxial relationship with the adjacent crystalline organic thin film.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {4}
}

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