DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Single event upset protection circuit and method

Abstract

An SEU protection circuit comprises first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence; the correction circuit requires that the data value be a 1-hot encoded value. A parity engine performs a parity operation on the n bits of the primary data value. A multiplexer receives the primary and redundant data values and the parity engine output at respective inputs, and is arranged to pass the primary data value to an output when the parity engine output indicates `odd` parity, and to pass the redundant data value to the output when the parity engine output indicates `even` parity. The primary and redundant data values are suitably state variables, and the parity engine is preferably an n-bit wide XOR or XNOR gate.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1243318
Patent Number(s):
9292378
Application Number:
14/290,648
Assignee:
TELEDYNE SCIENTIFIC & IMAGING, LLC (Thousand Oaks, CA)
Patent Classifications (CPCs):
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 May 29
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING

Citation Formats

Wallner, John, and Gorder, Michael. Single event upset protection circuit and method. United States: N. p., 2016. Web.
Wallner, John, & Gorder, Michael. Single event upset protection circuit and method. United States.
Wallner, John, and Gorder, Michael. Tue . "Single event upset protection circuit and method". United States. https://www.osti.gov/servlets/purl/1243318.
@article{osti_1243318,
title = {Single event upset protection circuit and method},
author = {Wallner, John and Gorder, Michael},
abstractNote = {An SEU protection circuit comprises first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence; the correction circuit requires that the data value be a 1-hot encoded value. A parity engine performs a parity operation on the n bits of the primary data value. A multiplexer receives the primary and redundant data values and the parity engine output at respective inputs, and is arranged to pass the primary data value to an output when the parity engine output indicates `odd` parity, and to pass the redundant data value to the output when the parity engine output indicates `even` parity. The primary and redundant data values are suitably state variables, and the parity engine is preferably an n-bit wide XOR or XNOR gate.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 22 00:00:00 EDT 2016},
month = {Tue Mar 22 00:00:00 EDT 2016}
}

Works referenced in this record:

Single event upset resistant semiconductor circuit element
patent, April 2003


Single event upset hardened latch
patent, January 2007


Radiation tolerant combinational logic cell
patent, February 2009


Techniques for mitigating, detecting, and correcting single event upset effects
patent, November 2009


Single event upset mitigation
patent, December 2010