Single-contact tunneling thermometry
Abstract
A single-contact tunneling thermometry circuit includes a tunnel junction formed between two objects. Junction temperature gradient information is determined based on a mathematical relationship between a target alternating voltage applied across the junction and the junction temperature gradient. Total voltage measured across the junction indicates the magnitude of the target alternating voltage. A thermal gradient is induced across the junction. A reference thermovoltage is measured when zero alternating voltage is applied across the junction. An increasing alternating voltage is applied while measuring a thermovoltage component and a DC rectification voltage component created by the applied alternating voltage. The target alternating voltage is reached when the thermovoltage is nullified or doubled by the DC rectification voltage depending on the sign of the reference thermovoltage. Thermoelectric current and current measurements may be utilized in place of the thermovoltage and voltage measurements. The system may be automated with a feedback loop.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1239684
- Patent Number(s):
- 9267851
- Application Number:
- 13/898,659
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2013 May 21
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Maksymovych, Petro. Single-contact tunneling thermometry. United States: N. p., 2016.
Web.
Maksymovych, Petro. Single-contact tunneling thermometry. United States.
Maksymovych, Petro. Tue .
"Single-contact tunneling thermometry". United States. https://www.osti.gov/servlets/purl/1239684.
@article{osti_1239684,
title = {Single-contact tunneling thermometry},
author = {Maksymovych, Petro},
abstractNote = {A single-contact tunneling thermometry circuit includes a tunnel junction formed between two objects. Junction temperature gradient information is determined based on a mathematical relationship between a target alternating voltage applied across the junction and the junction temperature gradient. Total voltage measured across the junction indicates the magnitude of the target alternating voltage. A thermal gradient is induced across the junction. A reference thermovoltage is measured when zero alternating voltage is applied across the junction. An increasing alternating voltage is applied while measuring a thermovoltage component and a DC rectification voltage component created by the applied alternating voltage. The target alternating voltage is reached when the thermovoltage is nullified or doubled by the DC rectification voltage depending on the sign of the reference thermovoltage. Thermoelectric current and current measurements may be utilized in place of the thermovoltage and voltage measurements. The system may be automated with a feedback loop.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {2}
}
Works referenced in this record:
Nanoscale thermal transport
journal, January 2003
- Cahill, David G.; Ford, Wayne K.; Goodson, Kenneth E.
- Journal of Applied Physics, Vol. 93, Issue 2, p. 793-818
Nanoscale thermal management
journal, January 2002
- Balandin, A. A.
- IEEE Potentials, Vol. 21, Issue 1
Scanning Thermal Microscopy
journal, August 1999
- Majumdar, A.
- Annual Review of Materials Science, Vol. 29, Issue 1
Scanning Thermal Microscopy
book, January 2006
- Cretin, Bernard; Gomès, Séverine; Trannoy, Nathalie
- Topics in Applied Physics
Spatially and temporally resolved thermal imaging of cyclically heated interconnects by use of scanning thermal microscopy
journal, August 2008
- Barbosa, Nicholas; Slifka, Andrew J.
- Microscopy Research and Technique, Vol. 71, Issue 8
Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films
journal, October 2007
- Gomès, S.; David, L.; Lysenko, V.
- Journal of Physics D: Applied Physics, Vol. 40, Issue 21
Quantitative Thermometry of Nanoscale Hot Spots
journal, January 2012
- Menges, Fabian; Riel, Heike; Stemmer, Andreas
- Nano Letters, Vol. 12, Issue 2, p. 596-601
Thermoelectricity in Molecular Junctions
journal, March 2007
- Reddy, P.; Jang, S.-Y.; Segalman, R. A.
- Science, Vol. 315, Issue 5818, p. 1568-1571
Near-field radiative heat transfer and noncontact friction
journal, October 2007
- Volokitin, A. I.; Persson, B. N. J.
- Reviews of Modern Physics, Vol. 79, Issue 4
Thermopower in scanning-tunneling-microscope experiments
journal, November 1990
- Sto/vneng, J. A.; Lipavský, P.
- Physical Review B, Vol. 42, Issue 14
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
patent, December 2002
- Hammiche, Azzedine; Montagu-Pollock, Hubert Murray; Reading, Michael
- US Patent Document 6,491,425
High resolution scanning thermal probe and method of manufacturing thereof
patent, February 2003
- Edinger, Klaus; Rangelow, Ivaylo W.
- US Patent Document 6,518,872
Probe for scanning thermal microscope
patent, April 2009
- Yao, Yuan; Liu, Chang-Hong; Fan, Shou-Shan
- US Patent Document 7,514,678