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Title: High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing

An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.
Inventors:
; ; ; ;
Issue Date:
OSTI Identifier:
1239655
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
Patent Number(s):
9,269,527
Application Number:
14/653,138
Contract Number:
AC52-07NA27344
Resource Relation:
Patent File Date: 2014 Feb 14
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Works referenced in this record:

4D ultrafast electron microscopy: Imaging of atomic motions, acoustic resonances, and moiré fringe dynamics
journal, December 2009

Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
journal, November 2012

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
journal, October 2008