Device and method for creating Gaussian aberration-corrected electron beams
Abstract
Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1236003
- Patent Number(s):
- 9,240,255
- Application Number:
- 14/199,947
- Assignee:
- University of Oregon
- DOE Contract Number:
- AC02-05CH11231
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Mar 06
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
McMorran, Benjamin, and Linck, Martin. Device and method for creating Gaussian aberration-corrected electron beams. United States: N. p., 2016.
Web.
McMorran, Benjamin, & Linck, Martin. Device and method for creating Gaussian aberration-corrected electron beams. United States.
McMorran, Benjamin, and Linck, Martin. Tue .
"Device and method for creating Gaussian aberration-corrected electron beams". United States. https://www.osti.gov/servlets/purl/1236003.
@article{osti_1236003,
title = {Device and method for creating Gaussian aberration-corrected electron beams},
author = {McMorran, Benjamin and Linck, Martin},
abstractNote = {Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {1}
}
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Works referenced in this record:
Imaging and focusing of neutrons by a zone plate
journal, September 1980
- Kearney, P. D.; Klein, A. G.; Opat, G. I.
- Nature, Vol. 287, Issue 5780
Phase zone plates for x rays and the extreme uv
journal, January 1974
- Kirz, Janos
- Journal of the Optical Society of America, Vol. 64, Issue 3
Grain size determination in nano-scale polycrystalline aggregates by precession illumination-hollow cone dark field imaging in the transmission electron microscope
journal, January 2012
- Kulovits, A. K.; Facco, G.; Wiezorek, J. M. K.
- Materials Characterization, Vol. 63, p. 17-26
Electron Vortex Beams with High Quanta of Orbital Angular Momentum
journal, January 2011
- McMorran, B. J.; Agrawal, A.; Anderson, I. M.
- Science, Vol. 331, Issue 6014, p. 192-195
Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
conference, August 2011
- Moeck, Peter; Rouvimov, Sergei; Hausler, Ines
- 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), 2011 11th IEEE International Conference on Nanotechnology