skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Device and method for creating Gaussian aberration-corrected electron beams

Abstract

Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.

Inventors:
;
Issue Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1236003
Patent Number(s):
9,240,255
Application Number:
14/199,947
Assignee:
University of Oregon
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Mar 06
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

McMorran, Benjamin, and Linck, Martin. Device and method for creating Gaussian aberration-corrected electron beams. United States: N. p., 2016. Web.
McMorran, Benjamin, & Linck, Martin. Device and method for creating Gaussian aberration-corrected electron beams. United States.
McMorran, Benjamin, and Linck, Martin. Tue . "Device and method for creating Gaussian aberration-corrected electron beams". United States. https://www.osti.gov/servlets/purl/1236003.
@article{osti_1236003,
title = {Device and method for creating Gaussian aberration-corrected electron beams},
author = {McMorran, Benjamin and Linck, Martin},
abstractNote = {Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {1}
}

Patent:

Save / Share:

Works referenced in this record:

Imaging and focusing of neutrons by a zone plate
journal, September 1980

  • Kearney, P. D.; Klein, A. G.; Opat, G. I.
  • Nature, Vol. 287, Issue 5780
  • DOI: 10.1038/287313a0

Phase zone plates for x rays and the extreme uv
journal, January 1974


Electron Vortex Beams with High Quanta of Orbital Angular Momentum
journal, January 2011

  • McMorran, B. J.; Agrawal, A.; Anderson, I. M.
  • Science, Vol. 331, Issue 6014, p. 192-195
  • DOI: 10.1126/science.1198804

Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
conference, August 2011

  • Moeck, Peter; Rouvimov, Sergei; Hausler, Ines
  • 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), 2011 11th IEEE International Conference on Nanotechnology
  • DOI: 10.1109/NANO.2011.6144300