On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging
Abstract
A monitoring system 100 comprising a material transport system 104 providing for the transportation of a substantially planar material 102, 107 through the monitoring zone 103 of the monitoring system 100. The system 100 also includes a line camera 106 positioned to obtain multiple line images across a width of the material 102, 107 as it is transported through the monitoring zone 103. The system 100 further includes an illumination source 108 providing for the illumination of the material 102, 107 transported through the monitoring zone 103 such that light reflected in a direction normal to the substantially planar surface of the material 102, 107 is detected by the line camera 106. A data processing system 110 is also provided in digital communication with the line camera 106. The data processing system 110 is configured to receive data output from the line camera 106 and further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material 102, 107. Also disclosed are methods of monitoring a quality parameter of a material.
- Inventors:
- Issue Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1234545
- Patent Number(s):
- 9,234,843
- Application Number:
- 14/238,918
- Assignee:
- Alliance for Sustainable Energy, LLC
- DOE Contract Number:
- AC36-08GO28308
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2011 Aug 25
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 30 DIRECT ENERGY CONVERSION
Citation Formats
Sopori, Bhushan, Rupnowski, Przemyslaw, and Ulsh, Michael. On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging. United States: N. p., 2016.
Web.
Sopori, Bhushan, Rupnowski, Przemyslaw, & Ulsh, Michael. On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging. United States.
Sopori, Bhushan, Rupnowski, Przemyslaw, and Ulsh, Michael. Tue .
"On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging". United States. https://www.osti.gov/servlets/purl/1234545.
@article{osti_1234545,
title = {On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging},
author = {Sopori, Bhushan and Rupnowski, Przemyslaw and Ulsh, Michael},
abstractNote = {A monitoring system 100 comprising a material transport system 104 providing for the transportation of a substantially planar material 102, 107 through the monitoring zone 103 of the monitoring system 100. The system 100 also includes a line camera 106 positioned to obtain multiple line images across a width of the material 102, 107 as it is transported through the monitoring zone 103. The system 100 further includes an illumination source 108 providing for the illumination of the material 102, 107 transported through the monitoring zone 103 such that light reflected in a direction normal to the substantially planar surface of the material 102, 107 is detected by the line camera 106. A data processing system 110 is also provided in digital communication with the line camera 106. The data processing system 110 is configured to receive data output from the line camera 106 and further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material 102, 107. Also disclosed are methods of monitoring a quality parameter of a material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {1}
}
Works referenced in this record:
Effect of Bi alloying on the hole transport in the dilute bismide alloy GaAsBi
journal, February 2011
- Kini, R. N.; Ptak, A. J.; Fluegel, B.
- Physical Review B, Vol. 83, Issue 7, Article No. 075307
Applying infrared thermography as a quality-control tool for the rapid detection of polymer-electrolyte-membrane-fuel-cell catalyst-layer-thickness variations
journal, August 2012
- Aieta, Niccolo V.; Das, Prodip K.; Perdue, Andrew
- Journal of Power Sources, Vol. 211, p. 4-11
Spectral irradiance model for tungsten halogen lamps in 340–850 nm wavelength range
journal, January 2010
- Ojanen, Maija; Kärhä, Petri; Ikonen, Erkki
- Applied Optics, Vol. 49, Issue 5
A New Defect Etch for Polycrystalline Silicon
journal, January 1984
- Sopori, B. L.
- Journal of The Electrochemical Society, Vol. 131, Issue 3
Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics
journal, May 1988
- Sopori, B. L.
- Review of Scientific Instruments, Vol. 59, Issue 5
Use of optical scattering to characterize dislocations in semiconductors
journal, January 1988
- Sopori, B. L.
- Applied Optics, Vol. 27, Issue 22