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Title: On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging

Abstract

A monitoring system 100 comprising a material transport system 104 providing for the transportation of a substantially planar material 102, 107 through the monitoring zone 103 of the monitoring system 100. The system 100 also includes a line camera 106 positioned to obtain multiple line images across a width of the material 102, 107 as it is transported through the monitoring zone 103. The system 100 further includes an illumination source 108 providing for the illumination of the material 102, 107 transported through the monitoring zone 103 such that light reflected in a direction normal to the substantially planar surface of the material 102, 107 is detected by the line camera 106. A data processing system 110 is also provided in digital communication with the line camera 106. The data processing system 110 is configured to receive data output from the line camera 106 and further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material 102, 107. Also disclosed are methods of monitoring a quality parameter of a material.

Inventors:
; ;
Issue Date:
Research Org.:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1234545
Patent Number(s):
9234843
Application Number:
14/238,918
Assignee:
Alliance for Sustainable Energy, LLC
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Aug 25
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 30 DIRECT ENERGY CONVERSION

Citation Formats

Sopori, Bhushan, Rupnowski, Przemyslaw, and Ulsh, Michael. On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging. United States: N. p., 2016. Web.
Sopori, Bhushan, Rupnowski, Przemyslaw, & Ulsh, Michael. On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging. United States.
Sopori, Bhushan, Rupnowski, Przemyslaw, and Ulsh, Michael. Tue . "On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging". United States. https://www.osti.gov/servlets/purl/1234545.
@article{osti_1234545,
title = {On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging},
author = {Sopori, Bhushan and Rupnowski, Przemyslaw and Ulsh, Michael},
abstractNote = {A monitoring system 100 comprising a material transport system 104 providing for the transportation of a substantially planar material 102, 107 through the monitoring zone 103 of the monitoring system 100. The system 100 also includes a line camera 106 positioned to obtain multiple line images across a width of the material 102, 107 as it is transported through the monitoring zone 103. The system 100 further includes an illumination source 108 providing for the illumination of the material 102, 107 transported through the monitoring zone 103 such that light reflected in a direction normal to the substantially planar surface of the material 102, 107 is detected by the line camera 106. A data processing system 110 is also provided in digital communication with the line camera 106. The data processing system 110 is configured to receive data output from the line camera 106 and further configured to calculate and provide substantially contemporaneous information relating to a quality parameter of the material 102, 107. Also disclosed are methods of monitoring a quality parameter of a material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {1}
}

Works referenced in this record:

Effect of Bi alloying on the hole transport in the dilute bismide alloy GaAs 1 x Bi x
journal, February 2011


Review of automated visual inspection 1983-1993, Part I: conventional approaches
conference, August 1993


Spectral irradiance model for tungsten halogen lamps in 340–850 nm wavelength range
journal, January 2010


A New Defect Etch for Polycrystalline Silicon
journal, January 1984


Use of optical scattering to characterize dislocations in semiconductors
journal, January 1988


Method of inspecting microscopic surface defects
patent, May 1984


Apparatus for measuring the color of a brilliant-cut diamond
patent, November 1984


Surface condition judging apparatus
patent, April 1986


Automatic contaminants detection apparatus
patent, September 1986


Surface defect inspecting apparatus
patent, December 1986


Three-dimensional range camera
patent, August 1987


Particle detection method and apparatus
patent, September 1988


Surface pit detection system and method
patent, December 1988


Measuring apparatus for etching pits
patent, June 1989


Apparatus for inspecting wafers
patent, November 1989


Etch pit density measuring method
patent, May 1990


Fluorescent penetrant inspection sensor
patent, November 1990


Method and system for automated measurement of whole-wafer etch pit density in GaAs
patent, April 1991


Optical illumination and inspection system for wafer and solar cell defects
patent, August 1994


Video inspection system employing multiple spectrum LED illumination
patent, November 1994


Defect detecting device for two-layer parts, in particular for solar cells
patent, November 1994


Defect mapping system
patent, April 1995


Apparatus and method for inspection of high component density printed circuit board
patent, October 1995


Non-contact optical techniques for measuring surface conditions
patent, February 1996


Processing for the optical sorting of bulk material
patent, December 1996


Two-phase optical inspection method and apparatus for defect detection
patent, December 1997


Wafer inspection method and apparatus using diffracted light
patent, July 1998


Peripheral edge exposure method
patent, September 1998


Computer aided inspection machine
patent, May 2000


Method for real-time in-line testing of semiconductor wafers
patent, November 2001


Arrangement and method for inspection of surface quality
patent, December 2001


Intelligent light source
patent, October 2002


Real-time in-line testing of semiconductor wafers
patent, June 2005


Device and method for testing a membrane electrode assembly
patent, September 2006


Membrane electrode assemblies for use in fuel cells
patent, May 2007


Material composition analysis system and method
patent, April 2008


High resolution monitoring of CD variations
patent, July 2009


Testing system for solar cells
patent, March 2010


Fuel cell
patent, March 2010


Automated wafer defect inspection system and a process of performing such inspection
patent, June 2010


Wafer characteristics via reflectometry
patent, October 2010


Visual Displacement Sensor
patent-application, October 2002


Radiation Image Storage Panel
patent-application, November 2002


Variable Electrostatic Spray Coating Apparatus and Method
patent-application, December 2002


Combination Thin-Film Stress and Thickness Measurement Device
patent-application, November 2003


Optical System for Measuring Samples Using Short Wavelength Radiation
patent-application, August 2004


Method and Apparatus for Measuring Loading of Waterproofing Agent in Carbon Substrate
patent-application, February 2005


Real-Time In-Line Testing of Semiconductor Wafers
patent-application, September 2005


Method and its apparatus for inspecting particles or defects of a semiconductor device
patent-application, December 2005


Combinatorial Method and Apparatus for Screening Electrochemical Materials
patent-application, January 2006


Interferometer and Shape Measuring Method
patent-application, November 2006


In Line Thickness Measurement
patent-application, January 2007


Method for Measuring Thin Films
patent-application, May 2007


Interferometers for the Measurement of Large Diameter Thin Wafers
patent-application, October 2007


Dynamic Metrology Sampling for a Dual Damascene Process
patent-application, October 2007


Systems and Methods for Detecting and Indicating Fault Conditions in Electrochemical Cells
patent-application, November 2007


Automated Selection of X-Ray Reflectometry Measurement Locations
patent-application, November 2007


Batteries, Electrodes for Batteries, and Methods of Their Manufacture
patent-application, January 2008


Apparatus and Method for Determining Service Life of Electrochemical Energy Sources Using Combined Ultrasonic and Electromagnetic Testing
patent-application, February 2008


Fuel Cell Diagnostic Apparatus and Diagnostic Method
patent-application, February 2008


Optical Inspection of Flat Media Using Direct Image Technology
patent-application, March 2008


Fiber Optic Based In-situ Diagnostics For PEM Fuel Cells
patent-application, May 2008


Fuel Cell Evaluation Method And Fuel Cell Evaluation Apparatus
patent-application, June 2008


Interferometric Endpoint Determination in a Substrate Etching Process
patent-application, June 2008


System and Method for Fuel Cell Material X-ray Analysis
patent-application, July 2008


Multi-MEA test station and multi-MEA test method using the same
patent-application, August 2008


Apparatus For Measuring Defects In A Glass Sheet
patent-application, August 2008


Methods and Systems for Detecting Biological and Chemical Materials on a Submicron Structured Substrate
patent-application, November 2008


Photovoltaic Devices in Tandem Architecture
patent-application, May 2009


Interferometer Device and Method
patent-application, May 2009


Optical Sensing System Based on a Micro-Array Structure
patent-application, July 2009


Measuring the Shape and Thickness Variation of a Wafer with High Slopes
patent-application, November 2009


Transparent Heat Shielding Multilayer Structure
patent-application, November 2009


Apparatus for and a Method of Determining Surface Characteristics
patent-application, December 2009


Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
patent-application, September 2010


Method and Apparatus for Thin Film Quality Control
patent-application, April 2011


Optical Detection Systems and Methods of Making and Using the Same
patent-application, October 2011


Method and Apparatus for Thin Film Quality Control
patent-application, April 2011


Optical Detection Systems and Methods of Making and Using the Same
patent-application, October 2011


Apparatus and Method for High-Speed Phase Shifting for Interferometric Measurement Systems
patent-application, December 2011


Wide Angle Bistatic Scanning Optical Ranging Sensor
patent-application, March 2014


In Situ Optical Diagnostic for Monitoring or Control of Sodium Diffusion in Photovoltaics Manufacturing
patent-application, April 2014