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Title: Method of measuring luminescence of a material

Abstract

A method of measuring luminescence of a material is disclosed. The method includes applying a light source to excite an exposed material. The method also includes amplifying an emission signal of the material. The method further includes measuring a luminescent emission at a fixed time window of about 10 picoseconds to about 10 nanoseconds. The luminescence may be radio photoluminescence (RPL) or optically stimulated luminescence (OSL).

Inventors:
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1229734
Patent Number(s):
9,213,106
Application Number:
13/449,607
Assignee:
BATTELLE MEMORIAL INSTITUTE
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Apr 08
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Miller, Steven D. Method of measuring luminescence of a material. United States: N. p., 2015. Web.
Miller, Steven D. Method of measuring luminescence of a material. United States.
Miller, Steven D. Tue . "Method of measuring luminescence of a material". United States. https://www.osti.gov/servlets/purl/1229734.
@article{osti_1229734,
title = {Method of measuring luminescence of a material},
author = {Miller, Steven D.},
abstractNote = {A method of measuring luminescence of a material is disclosed. The method includes applying a light source to excite an exposed material. The method also includes amplifying an emission signal of the material. The method further includes measuring a luminescent emission at a fixed time window of about 10 picoseconds to about 10 nanoseconds. The luminescence may be radio photoluminescence (RPL) or optically stimulated luminescence (OSL).},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {12}
}

Patent:

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Works referenced in this record:

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