Title: Imaging arrangement and microscope

Abstract

An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

Inventors:

Pertsinidis, Alexandros; Chu, Steven

Issue Date:

Tue Dec 15 00:00:00 EST 2015

Research Org.:

Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1229733

Patent Number(s):

9213176

Application Number:

13/132,598

Assignee:

The Regents of The University of California

Patent Classifications (CPCs):

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

Show more

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

G02B21/0056 - {based on optical coherence, e.g. phase-contrast arrangements, interference arrangements}
G02B21/0076 - {arrangements using fluorescence or luminescence}
G02B21/16 - adapted for ultra-violet illumination {
G02B21/18 - Arrangements with more than one light path, e.g. for comparing two specimens

Show less

DOE Contract Number:  

AC02-05CH11231

Resource Type:

Patent

Resource Relation:

Patent File Date: 2009 Dec 01

Country of Publication:

United States

Language:

English

Subject:

42 ENGINEERING