Global to push GA events into
skip to main content

Title: High-speed volume measurement system and method

Disclosed is a volume sensor having first, second, and third laser sources emitting first, second, and third laser beams; first, second, and third beam splitters splitting the first, second, and third laser beams into first, second, and third beam pairs; first, second, and third optical assemblies expanding the first, second, and third beam pairs into first, second, and third pairs of parallel beam sheets; fourth, fifth, and sixth optical assemblies focusing the first, second, and third beam sheet pairs into fourth, fifth, and sixth beam pairs; and first, second, and third detector pairs receiving the fourth, fifth, and sixth beam pairs and converting a change in intensity of at least one of the beam pairs resulting from an object passing through at least one of the first, second, and third parallel beam sheets into at least one electrical signal proportional to a three-dimensional representation of the object.
Inventors:
; ;
Issue Date:
OSTI Identifier:
1226820
Assignee:
U.S. Department of Energy (Washington, DC) KAPL
Patent Number(s):
9,194,691
Application Number:
14/088,567
Contract Number:
AC12-00SN39357
Resource Relation:
Patent File Date: 2013 Nov 25
Research Org:
Knolls Atomic Power Laboratory (KAPL), Niskayuna, NY (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Other works cited in this record:

Method And Apparatus For Measuring Mutually Perpendicular Dimensions
patent, March 1975

Signature analysis apparatus
patent, November 1992

Optical part inspection system
patent, January 1995

Method and apparatus for measuring the dimensions of an object
patent, January 1995

Apparatus and method for particle analysis
patent, June 1995

Threaded parts inspection device
patent, July 1997

High speed opto-electronic gage and method for gaging
patent, April 2000

Product scanning system and method
patent, June 2002

Detection system
patent, July 2003

Method and system for optically inspecting parts
patent, March 2013

Method and system for optically inspecting parts
patent, October 2013

Similar records in DOepatents and OSTI.GOV collections: