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Title: Imaging based refractometer for hyperspectral refractive index detection

Abstract

Refractometers for simultaneously measuring refractive index of a sample over a range of wavelengths of light include dispersive and focusing optical systems. An optical beam including the range of wavelengths is spectrally spread along a first axis and focused along a second axis so as to be incident to an interface between the sample and a prism at a range of angles of incidence including a critical angle for at least one wavelength. An imaging detector is situated to receive the spectrally spread and focused light from the interface and form an image corresponding to angle of incidence as a function of wavelength. One or more critical angles are identified and corresponding refractive indices are determined.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1226819
Patent Number(s):
9194798
Application Number:
13/768,802
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Feb 15
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Baba, Justin S., and Boudreaux, Philip R. Imaging based refractometer for hyperspectral refractive index detection. United States: N. p., 2015. Web.
Baba, Justin S., & Boudreaux, Philip R. Imaging based refractometer for hyperspectral refractive index detection. United States.
Baba, Justin S., and Boudreaux, Philip R. Tue . "Imaging based refractometer for hyperspectral refractive index detection". United States. https://www.osti.gov/servlets/purl/1226819.
@article{osti_1226819,
title = {Imaging based refractometer for hyperspectral refractive index detection},
author = {Baba, Justin S. and Boudreaux, Philip R.},
abstractNote = {Refractometers for simultaneously measuring refractive index of a sample over a range of wavelengths of light include dispersive and focusing optical systems. An optical beam including the range of wavelengths is spectrally spread along a first axis and focused along a second axis so as to be incident to an interface between the sample and a prism at a range of angles of incidence including a critical angle for at least one wavelength. An imaging detector is situated to receive the spectrally spread and focused light from the interface and form an image corresponding to angle of incidence as a function of wavelength. One or more critical angles are identified and corresponding refractive indices are determined.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {11}
}

Patent:

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