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Title: Systems and methods for sample analysis

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1223693
Assignee:
Purdue Research Foundation (West Lafayette, IN) CHO
Patent Number(s):
9,165,752
Application Number:
14/566,838
Contract Number:
FG02-06ER15807
Resource Relation:
Patent File Date: 2014 Dec 11
Research Org:
Purdue Research Foundation, West Lafayette, IN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Works referenced in this record:

A novel cold plasma jet generated by atmospheric dielectric barrier capillary discharge
journal, May 2006