Systems and methods for sample analysis

Title: Systems and methods for sample analysis

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Inventors:: Cooks, Robert Graham; Li, Guangtao; Li, Xin; Ouyang, Zheng

Issue Date:: 2015-10-20

OSTI Identifier:: 1223693

Assignee:: Purdue Research Foundation (West Lafayette, IN) CHO

Patent Number(s):: 9,165,752

Application Number:: 14/566,838

Contract Number:: FG02-06ER15807

Resource Relation:: Patent File Date: 2014 Dec 11

Research Org:: Purdue Research Foundation, West Lafayette, IN (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

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Other works cited in this record:

Method and system for desorption electrospray ionization
patent, February 2008

Takats, Zoltan; Gologan, Bogdan; Wiseman, Justin
US Patent Document 7,335,897
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=/netahtml/PTO/search-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN/7335897

A novel cold plasma jet generated by atmospheric dielectric barrier capillary discharge
journal, May 2006

Zhang, Jialiang; Sun, Jiao; Wang, Dezhen
Thin Solid Films, Vol. 506-507, p. 404-408
DOI: 10.1016/j.tsf.2005.08.088

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