Electron beam diagnostic system using computed tomography and an annular sensor

Elmer, John W.; Teruya, Alan T.

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Title: Electron beam diagnostic system using computed tomography and an annular sensor

Abstract

A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.

Inventors:: Elmer, John W.; Teruya, Alan T.

Issue Date:: Tue Aug 11 00:00:00 EDT 2015

Research Org.:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1209341

Patent Number(s):: 9105448

Application Number:: 14/305,905

Assignee:: Lawrence Livermore National Security, LLC (Livermore, CA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/2914 - {Measurement of spatial distribution of radiation}

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/24405 - Faraday cages
H01J2237/24542 - Beam profile
H01J2237/28 - Scanning microscopes
H01J2237/30472 - Controlling the beam
H01J37/244 - Detectors
H01J37/315 - for welding {

Show less

DOE Contract Number:: AC52-07NA27344

Resource Type:: Patent

Resource Relation:: Patent File Date: 2014 Jun 16

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS; 42 ENGINEERING

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                    Elmer, John W., and Teruya, Alan T. Electron beam diagnostic system using computed tomography and an annular sensor.  United States: N. p., 2015. 
        Web.

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                    Elmer, John W., & Teruya, Alan T. Electron beam diagnostic system using computed tomography and an annular sensor.  United States.

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                    Elmer, John W., and Teruya, Alan T. Tue .  
        "Electron beam diagnostic system using computed tomography and an annular sensor".  United States.  https://www.osti.gov/servlets/purl/1209341.

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@article{osti_1209341,

  title        = {Electron beam diagnostic system using computed tomography and an annular sensor},

  author       = {Elmer, John W. and Teruya, Alan T.},

  abstractNote = {A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Aug 11 00:00:00 EDT 2015},

  month        = {Tue Aug 11 00:00:00 EDT 2015}

}

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