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Title: Electron beam diagnostic system using computed tomography and an annular sensor

A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
Inventors:
;
Issue Date:
OSTI Identifier:
1209341
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LSO
Patent Number(s):
9,105,448
Application Number:
14/305,905
Contract Number:
AC52-07NA27344
Resource Relation:
Patent File Date: 2014 Jun 16
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 42 ENGINEERING

Other works cited in this record:

Method of automatic measurement and focus of an electron beam and apparatus therefor
patent, January 1996

System for high resolution imaging and measurement of topographic and material features on a specimen
patent, July 1997

Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001

Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device
patent, December 2005

Trigger probe for determining the orientation of the power distribution of an electron beam
patent, July 2007

Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013

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