Sparse sampling and reconstruction for electron and scanning probe microscope imaging
Abstract
Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1202317
- Patent Number(s):
- 9093249
- Application Number:
- 14/482,754
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Sep 10
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 74 ATOMIC AND MOLECULAR PHYSICS
Citation Formats
Anderson, Hyrum, Helms, Jovana, Wheeler, Jason W., Larson, Kurt W., and Rohrer, Brandon R. Sparse sampling and reconstruction for electron and scanning probe microscope imaging. United States: N. p., 2015.
Web.
Anderson, Hyrum, Helms, Jovana, Wheeler, Jason W., Larson, Kurt W., & Rohrer, Brandon R. Sparse sampling and reconstruction for electron and scanning probe microscope imaging. United States.
Anderson, Hyrum, Helms, Jovana, Wheeler, Jason W., Larson, Kurt W., and Rohrer, Brandon R. Tue .
"Sparse sampling and reconstruction for electron and scanning probe microscope imaging". United States. https://www.osti.gov/servlets/purl/1202317.
@article{osti_1202317,
title = {Sparse sampling and reconstruction for electron and scanning probe microscope imaging},
author = {Anderson, Hyrum and Helms, Jovana and Wheeler, Jason W. and Larson, Kurt W. and Rohrer, Brandon R.},
abstractNote = {Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {7}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing
conference, August 2011
- Song, Bo; Xi, Ning; Yang, Ruiguo
- 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), 2011 11th IEEE International Conference on Nanotechnology
Compressed Sensing and Electron Microscopy
book, January 2012
- Binev, Peter; Dahmen, Wolfgang; DeVore, Ronald
- Modeling Nanoscale Imaging in Electron Microscopy
Sparse imaging for fast electron microscopy
conference, February 2013
- Anderson, Hyrum S.; Ilic-Helms, Jovana; Rohrer, Brandon
- IS&T/SPIE Electronic Imaging, SPIE Proceedings
The Split Bregman Method for L1-Regularized Problems
journal, January 2009
- Goldstein, Tom; Osher, Stanley
- SIAM Journal on Imaging Sciences, Vol. 2, Issue 2
Towards neural circuit reconstruction with volume electron microscopy techniques
journal, October 2006
- Briggman, Kevin L.; Denk, Winfried
- Current Opinion in Neurobiology, Vol. 16, Issue 5, p. 562-570
Gigantic Montages with a Fully Automated FE-SEM (Serial Sections of a Mouse Brain Tissue)
journal, July 2010
- Ogura, K.; Yamada, M.; Hirahara, O.
- Microscopy and Microanalysis, Vol. 16, Issue S2
A novel method for acquiring large-scale automated scanning electron microscope data: METHOD FOR ACQUIRING LARGE-SCALE AUTOMATED SEM DATA
journal, August 2011
- Shiveley, A. R.; Shade, P. A.; Pilchak, A. L.
- Journal of Microscopy, Vol. 244, Issue 2
Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions
journal, July 2006
- Hayworth, Kj; Kasthuri, N.; Schalek, R.
- Microscopy and Microanalysis, Vol. 12, Issue S02
Stable recovery of sparse overcomplete representations in the presence of noise
journal, January 2006
- Donoho, D. L.; Elad, M.; Temlyakov, V. N.
- IEEE Transactions on Information Theory, Vol. 52, Issue 1
The restricted isometry property and its implications for compressed sensing
journal, May 2008
- Candès, Emmanuel J.
- Comptes Rendus Mathematique, Vol. 346, Issue 9-10, p. 589-592