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Title: Sparse sampling and reconstruction for electron and scanning probe microscope imaging

Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.
Inventors:
; ; ; ;
Issue Date:
OSTI Identifier:
1202317
Assignee:
Sandia Corporation (Albuquerque, NM) SSO
Patent Number(s):
9,093,249
Application Number:
14/482,754
Contract Number:
AC04-94AL85000
Resource Relation:
Patent File Date: 2014 Sep 10
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS

Works referenced in this record:

Towards neural circuit reconstruction with volume electron microscopy techniques
journal, October 2006
  • Briggman, Kevin L.; Denk, Winfried
  • Current Opinion in Neurobiology, Vol. 16, Issue 5, p. 562-570
  • DOI: 10.1016/j.conb.2006.08.010

The restricted isometry property and its implications for compressed sensing
journal, May 2008